PHOTONETICS TUNICS-OM 3646 HE 15 LASER SOURCE MODULES w option p6

PHOTONETICS Tunable Laser Sources. Resolution: Better than 10 pm (0.01 nm typical), Wavelength: dependent optical system performance assessment.

Model
PHOTONETICS TUNICS-OM 3646 HE 15
Calibration
Available on request
Price
$1,330
Status
In stock
RFQ ref
TUNICS-OM 3646 HE 15
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This unit

The PHOTONETICS TUNICS-OM 3646 HE 15 with option P6 is a tunable laser source module for precision optical testing and component characterization. This high output power configuration delivers +6 dBm optical output with wavelength tunability across the C-band, supporting both analog and digital modulation for dynamic measurement scenarios.


Technical Specifications



  • Wavelength Range: 1520 nm to 1570 nm

  • Wavelength Resolution: Better than 10 pm (0.01 nm typical); optional 1 pm high-resolution available

  • Optical Output Power (Option P6): +6 dBm (approximately 4 mW)

  • Optical Power Stability: ±0.01 dB

  • Side Mode Suppression Ratio: >45 dB (typical)

  • Relative Intensity Noise: >145 dB/Hz (typical)

  • Output Isolation: 35 dB

  • Return Loss: 60 dB

  • Fiber Output: SMF-28™, FC/APC connector

  • Analog Modulation: 150 Hz to 1 GHz (external)

  • Digital Modulation: 500 Hz to 1 MHz (internal or external)

  • External Intensity Modulation: 10 kHz to 1 GHz

  • Control Interfaces: RS-232 C and IEEE-488.2

  • Operating Temperature: +15 to +30°C

  • Power Supply: 100 to 240 V, 50 to 60 Hz (autoselect)


Key Features



  • Fine wavelength tuning (0.01 nm steps) enables precise component testing across the C-band

  • Excellent spectral purity with >45 dB side mode suppression and >145 dB/Hz RIN

  • Dual modulation capability - analog and digital - supports diverse measurement protocols

  • High return loss (60 dB) and output isolation (35 dB) minimize backreflection effects

  • Modular 35 × 130 × 250 mm³ form factor; up to 8 modules integrate into a single 19" rack chassis


Typical Applications



  • Component characterization (filters, couplers, amplifiers, detectors)

  • Chromatic dispersion and PMD measurement

  • Optical network validation and troubleshooting

  • Wavelength-dependent optical system performance assessment


Compatibility & Integration The module operates as a standalone bench instrument or within a multi-module 19" mainframe platform (448 × 133 × 370 mm³; 16.1 kg for 8-module configuration). RS-232 C and IEEE-488.2 interfaces enable local control and remote automation within test racks.

Specifications

ParameterValue
Power Range (dBm)'+6 dBm | Voltage / Current Range: 100 to 240 V, 50 to 60 Hz | Wavelength Range: 1520 nm to 1570 nm