PHOTONETICS TUNICS-OM 3646 HE 15 LASER SOURCE MODULES w option p6
PHOTONETICS Tunable Laser Sources. Resolution: Better than 10 pm (0.01 nm typical), Wavelength: dependent optical system performance assessment.
- Model
- PHOTONETICS TUNICS-OM 3646 HE 15
- Calibration
- Available on request
- Price
- $1,330
- Status
- In stock
- RFQ ref
- TUNICS-OM 3646 HE 15
This unit
The PHOTONETICS TUNICS-OM 3646 HE 15 with option P6 is a tunable laser source module for precision optical testing and component characterization. This high output power configuration delivers +6 dBm optical output with wavelength tunability across the C-band, supporting both analog and digital modulation for dynamic measurement scenarios.
Technical Specifications
- Wavelength Range: 1520 nm to 1570 nm
- Wavelength Resolution: Better than 10 pm (0.01 nm typical); optional 1 pm high-resolution available
- Optical Output Power (Option P6): +6 dBm (approximately 4 mW)
- Optical Power Stability: ±0.01 dB
- Side Mode Suppression Ratio: >45 dB (typical)
- Relative Intensity Noise: >145 dB/Hz (typical)
- Output Isolation: 35 dB
- Return Loss: 60 dB
- Fiber Output: SMF-28™, FC/APC connector
- Analog Modulation: 150 Hz to 1 GHz (external)
- Digital Modulation: 500 Hz to 1 MHz (internal or external)
- External Intensity Modulation: 10 kHz to 1 GHz
- Control Interfaces: RS-232 C and IEEE-488.2
- Operating Temperature: +15 to +30°C
- Power Supply: 100 to 240 V, 50 to 60 Hz (autoselect)
Key Features
- Fine wavelength tuning (0.01 nm steps) enables precise component testing across the C-band
- Excellent spectral purity with >45 dB side mode suppression and >145 dB/Hz RIN
- Dual modulation capability - analog and digital - supports diverse measurement protocols
- High return loss (60 dB) and output isolation (35 dB) minimize backreflection effects
- Modular 35 × 130 × 250 mm³ form factor; up to 8 modules integrate into a single 19" rack chassis
Typical Applications
- Component characterization (filters, couplers, amplifiers, detectors)
- Chromatic dispersion and PMD measurement
- Optical network validation and troubleshooting
- Wavelength-dependent optical system performance assessment
Compatibility & Integration The module operates as a standalone bench instrument or within a multi-module 19" mainframe platform (448 × 133 × 370 mm³; 16.1 kg for 8-module configuration). RS-232 C and IEEE-488.2 interfaces enable local control and remote automation within test racks.
Specifications
| Parameter | Value |
|---|---|
| Power Range (dBm) | '+6 dBm | Voltage / Current Range: 100 to 240 V, 50 to 60 Hz | Wavelength Range: 1520 nm to 1570 nm |