Agilent / Keysight 86145B Portable High Performance Optical Spectrum Analyzer

Agilent / Keysight Optical Spectrum Analyzers. Power Range (dBm): -70 dBm to +20 dBm, Wavelength Range: 600 nm to 1700 nm.

Model
Agilent / Keysight 86145B
Calibration
Available on request
Price
$16,099
Status
In stock
RFQ ref
86145B
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This unit

The Agilent/Keysight 86145B is a portable optical spectrum analyzer engineered for field deployment without sacrificing benchtop performance. Weighing 31 lbs with a 12.8" × 16.8" footprint, it delivers precise power and wavelength measurements across the 600–1700 nm range. The instrument excels in 50 GHz and wider WDM applications, where channel discrimination and spectral purity analysis are mission-critical.


Technical Specifications

Wavelength Coverage & Accuracy

  • Measurement range: 600 nm to 1700 nm

  • Span capability: 0.2 nm to full range; zero span supported

  • Wavelength accuracy after internal calibration: ±0.025 nm (1510–1570 nm), ±0.035 nm (1570–1640 nm)

  • User calibration accuracy: ±0.05 nm (within ±40 nm of signal), ±0.2 nm (full range)

  • Absolute accuracy (2-year factory cycle): ±0.5 nm

  • Reproducibility (≤1 min): ±0.003 nm; tuning repeatability: ±0.003 nm

  • Enhanced accuracy with internal gas cell: ±10 pm (1480–1565 nm) Resolution & Dynamic Range

  • Selectable resolution bandwidth (FWHM): 0.06 nm, 0.1 nm, 0.2 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm

  • RBW accuracy: ±4% (≥0.5 nm), ±6% (0.2 nm), ±12% (0.1 nm) in 1525–1610 nm region

  • Dynamic range at 0.5 nm offset: –70 dB; chop mode (1250–1610 nm): –70 dB

  • Offset-dependent: –60 dB (±0.8 nm), –58 dB (±0.5 nm), –55 dB (±0.4 nm), –40 dB (±0.2 nm) at 1550 nm Power Measurement

  • Amplitude accuracy at –20 dBm (1550 nm, 20–30°C): ±0.35 dB

  • Safe input levels: +20 dBm maximum; +15 dBm per channel (1525–1700 nm), +30 dBm total

  • Scale fidelity: ±0.07 dB (autorange off), ±0.05 dB (≤0 dBm inputs, characteristic)

  • Amplitude stability (1 minute): ±0.01 dB; flatness (1290–1330 nm): ±0.2 dB

  • Polarization dependence (1310 nm): ±0.25 dB Sweep Performance

  • Maximum sweep rate: 40 nm/50 ms

  • Zero-span sampling: 50 µs per trace point

  • Sweep cycles: <180 ms (50 nm span, auto zero off), <340 ms (50 nm span), <400 ms (100 nm span), <650 ms (500 nm span)


Key Features



  • Built-in test applications including Amplifier Test, Source Test, and WDM Test

  • Compact, field-portable architecture optimized for demanding environments

  • High wavelength reproducibility and tuning stability for dense WDM systems

  • Flexible resolution bandwidth selection for narrowband and broadband analysis


Typical Applications



  • WDM system commissioning and maintenance

  • Optical amplifier characterization

  • Light source quality verification

  • Channel power and isolation measurements

Specifications

ParameterValue
Voltage / Current Range44–444 Hz, 90–260 VAC | Wavelength Range: 600 nm to 1700 nm