Agilent / Keysight 86145B Portable High Performance Optical Spectrum Analyzer
Agilent / Keysight Optical Spectrum Analyzers. Power Range (dBm): -70 dBm to +20 dBm, Wavelength Range: 600 nm to 1700 nm.
- Model
- Agilent / Keysight 86145B
- Calibration
- Available on request
- Price
- $16,099
- Status
- In stock
- RFQ ref
- 86145B
This unit
The Agilent/Keysight 86145B is a portable optical spectrum analyzer engineered for field deployment without sacrificing benchtop performance. Weighing 31 lbs with a 12.8" × 16.8" footprint, it delivers precise power and wavelength measurements across the 600–1700 nm range. The instrument excels in 50 GHz and wider WDM applications, where channel discrimination and spectral purity analysis are mission-critical.
Technical Specifications
Wavelength Coverage & Accuracy- Measurement range: 600 nm to 1700 nm
- Span capability: 0.2 nm to full range; zero span supported
- Wavelength accuracy after internal calibration: ±0.025 nm (1510–1570 nm), ±0.035 nm (1570–1640 nm)
- User calibration accuracy: ±0.05 nm (within ±40 nm of signal), ±0.2 nm (full range)
- Absolute accuracy (2-year factory cycle): ±0.5 nm
- Reproducibility (≤1 min): ±0.003 nm; tuning repeatability: ±0.003 nm
- Enhanced accuracy with internal gas cell: ±10 pm (1480–1565 nm) Resolution & Dynamic Range
- Selectable resolution bandwidth (FWHM): 0.06 nm, 0.1 nm, 0.2 nm, 0.5 nm, 1 nm, 2 nm, 5 nm, 10 nm
- RBW accuracy: ±4% (≥0.5 nm), ±6% (0.2 nm), ±12% (0.1 nm) in 1525–1610 nm region
- Dynamic range at 0.5 nm offset: –70 dB; chop mode (1250–1610 nm): –70 dB
- Offset-dependent: –60 dB (±0.8 nm), –58 dB (±0.5 nm), –55 dB (±0.4 nm), –40 dB (±0.2 nm) at 1550 nm Power Measurement
- Amplitude accuracy at –20 dBm (1550 nm, 20–30°C): ±0.35 dB
- Safe input levels: +20 dBm maximum; +15 dBm per channel (1525–1700 nm), +30 dBm total
- Scale fidelity: ±0.07 dB (autorange off), ±0.05 dB (≤0 dBm inputs, characteristic)
- Amplitude stability (1 minute): ±0.01 dB; flatness (1290–1330 nm): ±0.2 dB
- Polarization dependence (1310 nm): ±0.25 dB Sweep Performance
- Maximum sweep rate: 40 nm/50 ms
- Zero-span sampling: 50 µs per trace point
- Sweep cycles: <180 ms (50 nm span, auto zero off), <340 ms (50 nm span), <400 ms (100 nm span), <650 ms (500 nm span)
Key Features
- Built-in test applications including Amplifier Test, Source Test, and WDM Test
- Compact, field-portable architecture optimized for demanding environments
- High wavelength reproducibility and tuning stability for dense WDM systems
- Flexible resolution bandwidth selection for narrowband and broadband analysis
Typical Applications
- WDM system commissioning and maintenance
- Optical amplifier characterization
- Light source quality verification
- Channel power and isolation measurements
Specifications
| Parameter | Value |
|---|---|
| Voltage / Current Range | 44–444 Hz, 90–260 VAC | Wavelength Range: 600 nm to 1700 nm |