HP / Agilent 66103A DC Power Module, 35V, 4.5A

The HP/Agilent 66103A is a 150 W DC power module engineered for automated test environments and production test systems. This modular unit inserts into the Agilent 66000 Modular Power System mainframe, enabling flexible multi-module configurations within minimal rack space. The 66103A delivers precise voltage and current control via GPIB programmability, making it ideal for bias power delivery, stimulus generation, and subassembly characterization in demanding ATE applications.

Technical Specifications

Output Voltage: 0 to 35 V

Output Current: 0 to 4.5 A

Maximum Power: 150 W

Programming Accuracy (at 25°C ±5°C): Voltage 0.03% + 13 mV; Current 0.03% + 2 mA

Readback Accuracy (25°C ±5°C): Voltage 0.02% + 2 mV; Current 0.02% + 6 mA

Voltage Ripple & Noise (20 Hz to 20 MHz): 5 mV RMS / 10 mV peak-to-peak

Current Ripple & Noise: 2 mA RMS

Line Regulation: Voltage 1 mV; Current 0.5 mA

Load Regulation: Voltage 1 mV; Current 0.5 mA

Output Capacitance: 10,000 µF

Inductive Load Capability: Up to 100 mH

Operating Temperature: 0 to 55°C

Module Dimensions: 23 × 2 × 6 inches

Module Weight: 6 lbs

Key Features

GPIB remote control and programming with SCPI compliance

Programmable over-voltage and over-current protection

Electronic calibration via GPIB or front-panel keyboard

Power-up self-test and on-demand diagnostics

Over-temperature protection

Five non-volatile memory states for configuration storage and recall

User-definable power-on state configuration

Output sequencing for complex test routines

Discrete Fault Indicator/Remote Inhibit (DFI/RI) signal output

VXIplug&play driver support

Typical Applications Bias power distribution for component and subassembly testing. Stimulus generation in functional and parametric test routines. Multi-module systems supporting up to eight 66103A modules in 4U of rack space.

Compatibility & Integration Designed for installation in the Agilent 66000A MPS Mainframe. Supports SCPI command set and VXIplug&play drivers for integration into automated test platforms.