ILX Lightwave LDX3525 – Precision Current Source

The ILX Lightwave LDX3525 is a precision current source engineered for laser diode characterization and control in laboratory and manufacturing environments. It delivers low-noise, highly stable current output with exceptional accuracy and minimal drift - critical requirements for advanced optical testing and integration into automated measurement systems.

Technical Specifications

• Range: 0 mA to 1000 mA (configurable to 500 mA)


• Accuracy: ±(0.1% of setting + 0.5 mA)


• Resolution: 1 µA


• Stability: < 0.01% over 1 hour at constant temperature


• Noise: < 10 µA RMS (0.1 Hz to 10 Hz bandwidth) Voltage Compliance


• Maximum: 5 V Modulation


• Analog Input: 0–5 V (0–100% current modulation)


• External Bandwidth: DC to 100 kHz


• Internal Frequencies: 1 kHz, 10 kHz, 100 kHz square wave


• Depth: 0% to 100% Power & Environment


• Input: 100–120 VAC or 200–240 VAC, 50/60 Hz


• Operating Temperature: 0 °C to 50 °C


• Storage Temperature: -40 °C to 70 °C


• Humidity: < 85% RH (non-condensing) Interfaces


• Current Monitor Output: 10 mV/mA


• Voltage Monitor Output: 1 V/V


• Remote Interlock: External safety interlock input

Key Features

• Sub-microramp current resolution enables fine-grained laser diode tuning


• < 0.01% thermal drift ensures long-term measurement confidence


• DC to 100 kHz modulation bandwidth supports both static and dynamic characterization


• Dual analog monitor outputs allow real-time feedback and data logging


• 5 V compliance voltage accommodates standard laser diode packages

Typical Applications

• Laser diode I-V characterization and parameter extraction


• Optical power stability testing and burn-in validation


• Integrated photonics device control and optimization


• Manufacturing test fixtures and automated probe stations

Compatibility & Integration The LDX3525 integrates into standard laboratory and production test setups through analog control and monitoring. Its current monitor and voltage monitor outputs connect directly to data acquisition systems, oscilloscopes, and automated test equipment. The external interlock input supports facility-level safety protocols.