Agilent / Keysight N5224A 43.5 GHz PNA Microwave Network Analyzer

The Keysight N5224A is a 43.5 GHz PNA Microwave Network Analyzer engineered for high-accuracy S-parameter characterization of complex microwave components and systems in R&D and manufacturing environments. It delivers system dynamic range to 127 dB with receiver dynamic range up to 132 dB, enabling precise measurements across demanding test scenarios. The instrument supports 2-port single-source or 4-port dual-source configurations, each with distinct performance capabilities.

Its +13 dBm output power and 38 dB power sweep range accommodate diverse component testing requirements.

Technical Specifications

• Frequency Range: 10 MHz to 43.5 GHz


• Ports: 2-port (single source) or 4-port (two built-in sources)


• System Dynamic Range: Up to 127 dB


• Receiver Dynamic Range: Up to 132 dB


• Dynamic Accuracy: 0.1 dB compression at +12 dBm input power


• Noise Floor: −114 dBm at 10 Hz IF bandwidth


• Output Power: +13 dBm


• Power Sweep Range: 38 dB


• Measurement Points: 100,001 points maximum


• Channels: 200 channels


• IF Bandwidth: 15 MHz


• Pulsed-RF Capability: Down to 50 ns pulse widths


• Power Consumption: 450 watts maximum


• Dimensions (with feet): 11.0 in (279.1 mm) H × 19.0 in (482.9 mm) W

Key Features

• Electronic and TRL/LRM calibration methods for on-wafer and fixture-corrected measurements


• Time-domain analysis for improved accuracy and filter characterization


• Frequency offset mode for mixer and amplifier distortion testing


• Material measurements, signal integrity analysis, and millimeter-wave characterization


• Transmission line, free-space, cavity, and coaxial probe measurement options


• Four front-panel USB ports (0.9 A limit) and five rear-panel USB ports (2.0 A limit)


• 10/100BaseT Ethernet connectivity


• Auto-switching power supply: 100–120 VAC or 220–240 VAC, 50/60/400 Hz

Typical Applications

• Component S-parameter verification and characterization


• On-wafer and fixture-based device testing


• Millimeter-wave system validation


• Pulsed-RF component analysis


• Material and dielectric property measurements

Compatibility & Integration USB 2.0 and 10/100BaseT Ethernet enable integration with automated test systems and remote control environments. Parallel port support accommodates legacy peripheral connections.