Keithley Yieldstation S900 Semiconductor Parametric Test System/Process Monitor
The Keithley Yieldstation S900 is a semiconductor parametric test system and process monitor designed for comprehensive electrical characterization of semiconductor devices and processes. It enables precise measurement of device parameters, ensuring quality control and process optimization in semiconductor manufacturing.
- Model
- Keithley S900
- Calibration
- Available on request
- Price
- $24,880
- Status
- In stock
- RFQ ref
- S900
This unit
The Keithley Yieldstation S900 is a semiconductor parametric test system and process monitor for electrical characterization of semiconductor devices and manufacturing processes. It delivers precise measurements of critical device parameters to ensure quality control and drive process optimization across semiconductor fabrication. The system enables detailed process monitoring to boost yield and quality through comprehensive electrical testing and parametric analysis.
Technical Specifications System Type: Semiconductor Parametric Test System and Process Monitor Primary Function: Electrical characterization of semiconductor devices and processes; quality control; process optimization; yield analysis. Architecture: Modular design with multiple instrument slots and interface cards. Integrates Source-Measure Units (SMUs) for voltage/current sourcing and response measurement. Includes capacitance/conductance meters for dielectric and capacitive parameter analysis. Low-level current measurement capabilities extend to picoammeter range. Switch matrix routes test signals to device under test. Probe card adapter interfaces with wafer probes and packaged devices.
Key Features
Source-Measure Units (SMUs) for precision voltage and current generation
Capacitance/conductance measurement for dielectric characterization
Picoammeter-range current measurement for low-level parametric testing
Switch matrix for flexible DUT signal routing
Modular instrumentation architecture supporting multiple test configurations
Probe card adapter for wafer and packaged device interfacing
Control & Software Dedicated workstation control with specialized test executive software. Unix-based system operation (Solaris). Measurement libraries support semiconductor technologies including CMOS and BiCMOS. System Reference Units (SRUs) available for calibration time reduction.
Typical Applications
Parametric testing of semiconductor wafers and packaged devices
Process monitoring during semiconductor manufacturing
Device yield optimization and analysis
Manufacturing process characterization and trending
Quality assurance and statistical process control
Compatibility & Integration Designed to interface with automated probers and handlers via probe card adapter. Integrates Test Star components and Keithley instrumentation modules for expanded measurement capabilities. Host computer connectivity enables remote programming and system control.
Keithley S900 — Repair & Calibration Service
Aumictech offers NIST-traceable calibration and repair for the Keithley S900. Calibration covers analog input channel accuracy and offset at all gain settings, analog output accuracy, digital I/O logic threshold verification, sample rate and timing accuracy, and trigger and synchronization bus functional verification. NI CompactRIO and PXI chassis also undergo backplane trigger line integrity check.. All calibrations ship with a NIST-traceable certificate. Turnaround is typically 1–3 business days after receipt.
Common Keithley S900 faults: power supply failure (cRIO-9073/9074), C-series slot connector wear, PXI chassis fan failure, GPIB interface failure on VXI controllers, BIOS/EEPROM corruption. NI CompactRIO most common faults are power supply failure on older cRIO-9073/9074 chassis and C-series module slot connector wear from repeated hot-swap cycles. PXI chassis fan failure is the most common wear item — chassis fans are field-replaceable. VXI embedded controllers most commonly develop EEPROM corruption and GPIB interface failure.
Keithley S900 price
This Keithley S900 is listed at $24,880. Calibration is available separately from $450. Contact us for volume pricing or if you need multiple units.
Keithley S900 calibration cost
NIST-traceable calibration for the Keithley S900 is $450 (standard — pass/fail certificate and calibration sticker) or $650 (full measured data at every test point, reference standards documented, traceability chain included). Calibration for this instrument covers analog input channel accuracy and offset at all gain settings, analog output accuracy, digital I/O logic threshold verification, sample rate and timing accuracy, and trigger and synchronization bus functional verification. NI CompactRIO and PXI chassis also undergo backplane trigger line integrity check.. Turnaround is 1 to 3 business days after receipt. See full calibration details →
