Keithley Series 2200G USB/GPIB DC Power Supplies

The Keithley Series 2200G Programmable DC Power Supplies deliver precise voltage and current outputs across five models, each equipped with USB and GPIB interfaces for remote operation and automated test integration. These units combine high-accuracy DC sourcing with flexible control capabilities, making them ideal for device characterization, system validation, and parametric testing in lab and production environments.

Technical Specifications Output Ratings

Voltage: 0–20 V, 0–30 V, 0–32 V, 0–60 V, or 0–72 V depending on model

Current: 0–5 A (20 V, 30 V models), 0–3 A (32 V), 0–2 A (60 V), 0–1 A (72 V)

Maximum Power: 86 W to 150 W; input consumption 250 VA to 350 VA Voltage Performance

Load Regulation: <0.01% + 2 mV

Line Regulation: <0.01% + 1–2 mV

Ripple and Noise (20 Hz–7 MHz): <1 mVRMS or 3–5 mVPP

Setting Accuracy: 0.03%; Setting Resolution: 1 mV

Readback Accuracy: 0.02% Current Performance

Load Regulation: <0.05% + 0.1–0.15 mA

Line Regulation: <0.05% + 1 mA

Setting Accuracy: 0.05%; Setting Resolution: 0.1 mA

Readback Accuracy: 0.05% Transient Response: <35 ms for rising and falling excursions to within 75 mV of terminal value with 1 A load

Key Features

Programmable Overvoltage Protection (OVP) with automatic output shutdown below 1 V

Floating voltage rating up to 100 V DC + peak AC relative to protective earth

Vacuum fluorescent display showing programmed and actual values

40 setup memories for configuration storage

List Mode: up to seven lists with 80 steps each; steps define voltage, current, and duration

Remote Sense compensation for lead-drop voltage correction

Two Digital I/O lines for external event synchronization

Typical Applications Component and module characterization, power supply validation, device burn-in testing, and automated test systems requiring precise DC sourcing with real-time monitoring.

Compatibility & Integration USB and GPIB interfaces enable direct integration into automated test environments. Remote Sense, Digital I/O, and List Mode support complex test sequences and synchronized external control.