Agilent / Keysight E3647A DC Power Supply

The Agilent/Keysight E3647A is a 60 W dual-output linear DC power supply for benchtop and system integration applications. Engineered for R&D, production testing, and QA verification, it delivers clean power with low noise and exceptional regulation. Dual-range outputs, GPIB/RS-232 control, and SCPI compatibility enable precise voltage and current programming across demanding test scenarios.

Technical Specifications

Output Ratings (0 °C to 40 °C):

• Range 1: 0–35 V / 0.8 A


• Range 2: 0–60 V / 0.5 A


• Total power: 60 W Regulation & Stability:


• Load and line regulation: ±0.01% + offset


• Voltage stability (8 h): <0.02% + 2 mV


• Current stability (8 h): <0.1% + 1 mA Programming Accuracy (25 °C ± 5 °C):


• Voltage (output 1): <0.05% + 10 mV


• Voltage (output 2): <0.1% + 25 mV


• Current: <0.2% + 10 mA Ripple & Noise (20 Hz–20 MHz):


• Normal mode voltage: <8 mVpp / 1 mVrms


• Normal mode current: <4 mArms


• Common mode current (PARD): <1.5 µA rms AC Input Options:


• 100 Vac ± 10% (option 0E9)


• 115 Vac ± 10% (standard)


• 230 Vac ± 10% (option 0E3)


• Frequency: 47–63 Hz

Key Features

• Dual independent outputs with simultaneous voltage/current display


• Front panel binding posts and rear screw terminals for flexible connectivity


• Remote sensing via rear terminal to compensate load-lead voltage drops


• Rotary knob and keypad control with 10 mV / 1 mA resolution


• Five-slot non-volatile memory for setup storage and recall


• Output on/off control button


• GPIB (IEEE-488) and RS-232 interfaces for remote operation


• Safety Class I with protective earth terminal; UL3111-1, CSA 22.2 No. 1010.1, IEC 1010-1, EMC directive 89/336/EEC compliant

Typical Applications Suitable for semiconductor testing, circuit validation, power converter characterization, and automated test systems requiring precise dual-supply control with minimal noise and drift.

Compatibility & Integration SCPI-compatible programming enables integration into GPIB or RS-232 networked test environments. Dual outputs support independent or coordinated control of multiple voltage rails.