HP / Agilent 8110A Pulse Pattern Generator, 150 MHz

The HP/Agilent 8110A Pulse Pattern Generator delivers programmable pulse generation from 1 Hz to 150 MHz, enabling precise testing of digital circuits and logic devices. This dual-channel instrument generates single pulses, complex digital patterns, and multilevel signals with independently variable parameters including amplitude, width, delay, and transition time. Dual BNC outputs with 50 Ω impedance support continuous, external-triggered, and gated operation modes.

Technical Specifications Frequency and Timing

Frequency range: 1 Hz to 150 MHz

Frequency accuracy: ±0.5% ± 150 ps typical

Timing resolution: 10 ps

Transition time: 2 ns typical

Minimum pulse width: 3.3 ns

Pulse width accuracy: ±0.5% ± 250 ps typical

Delay range: 0 ns to (period – 6.6 ns), maximum 999 ms

Delay accuracy: ±5% ± 1 ns Output Specifications

Amplitude: 100 mV to 10 Vpp into 50 Ω load; 200 mVpp to 20 Vpp into 1 kΩ load

Amplitude resolution: 10 mV

Output impedance: 50 Ω typical

Pattern memory: 16 kbit per channel External Triggering

External input voltage: ±15 Vpp maximum

Input sensitivity: ≤300 mVpp typical

Input frequency range: DC to 150 MHz

Input impedance: 50 Ω

Trigger modes: Continuous, external-triggered, external gate, external width, manual

Key Features

Single- and dual-channel output configuration

RZ/NRZ (Return-to-Zero/Non-Return-to-Zero) operating modes

Three- and four-level signal generation

Internal PLL for clock recovery

SCPI programming commands supported

Graphic and LED display interfaces

Compact form factor

Typical Applications

Digital circuit and logic device characterization

High-speed digital system testing

Complex pattern generation for timing analysis

Functional validation of TTL and ECL logic families

Compatibility & Integration BNC connectors provide standard 50 Ω RF connectivity. Two output channels and one input channel enable flexible test configurations. SCPI command support enables remote operation and integration into automated test systems.