HP / Agilent 8012B 50Mhz Pulse Generator

The HP/Agilent 8012B is a 50 MHz pulse generator engineered for digital circuit characterization and test stimulus applications. It delivers precise, low-noise pulses with fast edges across a wide range of parameters, from 1 Hz repetition rates to sub-nanosecond transition times. The instrument features dual switchable output impedances, multiple operating modes including external triggering and gating, and front-panel controls optimized for rapid setup and validation of digital logic circuits and integrated circuits.

Technical Specifications Pulse Parameters

Repetition Rate: 1 Hz to 50 MHz

Pulse Width: 10 ns to 1 s

Pulse Delay: 35 ns to 1 s

Rise/Fall Time (variable): 5 ns to 0.5 s; (fixed): down to 3.5 ns

Jitter: <0.1% of programmed value + 50 ps

Maximum Duty Cycle: 75% up to 10 MHz Output Specifications

Amplitude (50 Ω load): 0.2 V to 5 V

Amplitude (high impedance load): 0.2 V to 10 V

Maximum Output: 16 V total

Offset: ±2.5 V (50 Ω source only)

Source Impedance: Switchable 50 Ω / High Z

Overshoot/Ringing: ±5% of amplitude; +10% (high impedance)

Preshoot: 5% of amplitude

Output Channels: Up to 2 selectable

Key Features

External triggering with 7 ns minimum signal width; selectable on positive or negative transition

Gate mode for synchronous output control via external edge detection

Operating modes: Normal, External trigger, Gate, Double Pulse, Square Wave, External Width, RZ

SYM/NORM/COMPL output format selection

Compact form factor: 142 mm H × 200 mm W × 330 mm D; 4 kg net weight

Universal AC supply: 100/120/220/240 Vrms (±10%/-15%), 48–440 Hz, 70 VA maximum

Operating temperature: 0°C to 55°C

Typical Applications Suitable for stimulus-response testing with digital oscilloscopes, circuit characterization, and board-level validation across multiple logic families.

Compatibility & Integration Supports RTL, DTL, TTL, selected ECL, and MOS logic families. Interfaces include trigger inputs, gate inputs, trigger outputs, and format selection connectors for integration into automated test systems.