HP / Agilent 8114A High Power Pulse Generator, 100 V / 2 A

The HP/Agilent 8114A is a single-channel high-power pulse generator engineered to produce fast, clean positive or negative pulses with user-definable amplitude, current, and duty cycle limits. Operating at pulse repetition rates up to 15 MHz with variable pulse widths and transition times as fast as 7 ns, the instrument delivers 100 V and 2 A into high-impedance loads, or 50 Vpp into 50 Ω matched conditions. Built-in protection features and an inhibit input allow external TTL signals to control output behavior, making it suitable for semiconductor device testing, laser diode driving, and high-speed digital circuit characterization. Full SCPI programmability, external triggering and gating, burst mode capability, and double-pulse generation provide the flexibility demanded by both benchtop evaluation and automated test environments. The instrument maintains low jitter and accurate, repeatable pulse generation across 0°C to 55°C ambient operation following a 30-minute warm-up period.

Technical Specifications

Maximum pulse amplitude: 100 V into high-impedance load; 50 Vpp into 50 Ω load

Maximum pulse current: 2 A

Pulse transition times: < 12 ns (high-impedance source into 50 Ω); < 7 ns (50 Ω/50 Ω mode)

Repetition rate: Up to 15 MHz

Pulse width: Variable

Baseline voltage: 0 V typical; optional ±25 V shift (Option 001)

Output waveforms: Positive or negative pulses

Operating temperature: 0°C to 55°C ambient

Key Features

Low jitter and highly repeatable pulse generation

Programmable voltage, current, and duty cycle limits with DUT protection

TTL-compatible inhibit input supporting edge and level triggering

Counted burst mode and configurable double-pulse capability

External triggering and gating support

Full SCPI programmability via front-panel graphic display

Fast memory store/recall of hundreds of instrument configurations (optional 1 MB memory card)

Typical Applications

Semiconductor device and component testing

Laser diode driver evaluation

High-speed digital circuit characterization

Automated test system integration

Compatibility & Integration External synchronization via manual trigger key or external signal; TTL control inputs for gate enable/disable functionality.