Agilent / Keysight MSO9104A Mixed Signal Oscilloscope: 1 GHz, 4 Analog plus 16 Digital Channels

The Agilent/Keysight MSO9104A is a mixed-signal oscilloscope combining 4 analog channels at 1 GHz bandwidth with 16 high-speed digital channels in a single instrument. It integrates oscilloscope, logic analyzer, and protocol analyzer functionality for complex signal analysis in embedded systems and demanding test environments.

Technical Specifications

• Bandwidth: 1 GHz


• Channels: 4 analog + 16 digital


• Sample rate: 20 GSa/s (analog, 2-channel mode); 10 GSa/s (4-channel mode)


• Digital sample rate: 2 GSa/s


• Memory depth: 10 Mpts per channel standard, upgradeable to 1 Gpts (analog); 128 Mpts standard (digital)


• Vertical resolution: 8 bits (>12 bits with averaging)


• Rise/fall time: 253 ps (10–90%), 174 ps (20–80%)


• Noise floor: 1.24 mVrms at 50 mV/div


• Input sensitivity: 1 mV/div to 5 V/div (1 MΩ); 1 mV/div to 1 V/div (50 Ω)


• Input impedance: 50 Ω ±2.5%, 1 MΩ ±1% (11 pF typical)


• Maximum input voltage: 150 Vrms/dc (1 MΩ), 5 Vrms (50 Ω)


• Channel-to-channel isolation: 50 dB (DC–50 MHz), 40 dB (>50 MHz–1 GHz), 25 dB (>1 GHz–4 GHz)


• Input coupling: AC (3.5 Hz) or DC (1 MΩ); DC (50 Ω)


• Hardware bandwidth limit: 20 MHz (1 MΩ input) Acquisition & Triggering


• Waveform capture rate: 250,000 waveforms per second


• Segmented memory: Supported for both analog and digital channels


• Triggering: InfiniiScan advanced triggering across any combination of analog and digital signals simultaneously

Key Features

• 15-inch XGA display with compact 9-inch depth


• Weight: 26 pounds


• LXI Class C compliance with LAN connectivity (RJ-45)


• Built-in Web control

Typical Applications Embedded system design, mixed-signal protocol debugging, digital-to-analog signal correlation, high-speed digital measurement, and complex multi-domain signal capture requiring synchronized analog and digital analysis.

Connectivity & Integration LAN interface with LXI Class C support enables remote control and integration into automated test environments.