Agilent / Keysight N5162A MXG ATE Vector Signal Generator, up to 6 GHz

The Agilent/Keysight N5162A MXG ATE Vector Signal Generator delivers signal generation from 100 kHz to 6 GHz for automated test equipment applications. Purpose-built for ATE integration, it features rear-panel connectors and a blank front panel, eliminating unnecessary front-end controls for rack-mounted systems. The instrument combines fast frequency switching, wide dynamic range, and flexible modulation capabilities to support RF and wireless device characterization across multiple standards.

Technical Specifications

• Range: 100 kHz to 3 GHz or 6 GHz (configuration-dependent)


• Resolution: 0.01 Hz


• Switching speed: ≤5 ms (SCPI/List modes, typical); ≤1.15 ms or ≤900 µs with Option UNZ


• Digital sweep modes: step sweep (2 to 65535 points) and list sweep (1 to 1601 points)


• Dwell time range: 100 µs to 100 seconds


• Triggering options: free run, external, timer, or bus (GPIB, LAN, USB) Amplitude Characteristics


• Output power: -110 dBm to +23 dBm (up to 3 GHz); maximum +18 dBm at 0 MHz, +10 dBm at 6 GHz


• Amplitude resolution: 0.02 dB (nominal)


• Step attenuator: 0 to 130 dB in 5 dB increments (electronic)


• Absolute level accuracy (CW, ALC on): ±0.6 to ±0.8 dB depending on frequency


• Maximum reverse power: 2 W nominal across 250 kHz to 6 GHz Signal Quality


• Phase noise: ≤-121 dBc/Hz at 1 GHz, 20 kHz offset (typical)


• W-CDMA ACLR: -65 dBc (4-carrier)


• Modulation types: AM, FM, phase modulation, pulse, ASK, FSK, MSK, PSK, QAM


• VSWR: 1.7:1 to 2.4:1 depending on frequency band

Key Features

• High-speed frequency switching for list and step sweep applications


• Wide output power range with fine amplitude control


• Multiple trigger modes for ATE synchronization


• Low phase noise for demanding RF measurements


• Configurable frequency range options

Typical Applications Wireless transceiver testing, multi-carrier signal simulation, receiver sensitivity characterization, and modulation quality verification in production environments.

Compatibility & Integration Designed for ATE system integration with GPIB, LAN, and USB control interfaces. Rear-panel RF and control connections enable efficient slot-based installation in automated test racks.