Keysight (Agilent) E4727A Advanced Low-Frequency Noise Analyzer

The Keysight E4727A Advanced Low-Frequency Noise Analyzer is a modular PXIe-based system for precise characterization of low-frequency noise in semiconductor devices, components, and integrated circuits. It measures 1/f (flicker) noise, random telegraph noise (RTN), and burst noise across frequencies from 0.03 Hz to 10 MHz or 40 MHz with noise sensitivity to −183 dBV²/Hz. The system supports on-wafer and discrete device measurements of BJTs, FETs, diodes, resistors, and multi-terminal circuits, with options for 3-, 4-, 5-, or 6-terminal device configurations.

It integrates with Keysight WaferPro Express software for automated test sequencing, wafer mapping, and data analysis.

Technical Specifications

• Noise Measurement Range: 0.03 Hz to 10 MHz or 40 MHz


• Noise Floor: −183 dBV²/Hz


• Supported Devices: BJTs, FETs, diodes, resistors, Op-Amps, comparators; 3-, 4-, 5-, or 6-terminal configurations


• Noise Types: 1/f (flicker) noise, random telegraph noise (RTN), burst noise


• DC Measurement: Up to 0.1 A and 200 V (with supported parameter analyzers)


• Bias Voltage Range: Gate/Base to ±50 V; Drain/Collector to ±200 V; Substrate to ±50 V; Resistor to ±200 V


• Current/Voltage/Power: Up to 0.1 A / 200 V / 10 W


• Source and Load Impedance: 25 selectable values from 0 Ω to 100 MΩ


• Maximum Input Resistance: 10 MΩ


• RTN Time Step: 2.5 ns minimum


• RTN Sampling: 8M-point maximum; continuous; interval calculated by 1/(500 MHz/2^n) with n=0~32; count by 2^n with n=10~24

Key Features

• Modular architecture minimizes system noise and footprint within PXIe chassis


• Offers 25 impedance values with software selection for device-specific optimization


• Supports simultaneous DC characterization and noise parameter measurement


• Multiple bias voltage and current configurations for diverse device types

Typical Applications

• 1/f noise characterization in analog and mixed-signal devices


• Random telegraph signal analysis in semiconductor components


• DC parameter measurement coupled with low-frequency noise assessment


• On-wafer device reliability and noise behavior screening

Compatibility & Integration

• Compatible with Keysight parameter analyzers (4142B with 41420A/41421B, 4155B/C with MPSMU, B1500A)


• Integrates with Cascade Summit 12K and Cascade S300 probe stations


• Control via LAN, USB, and GPIB interfaces


• WaferPro Express software for automated measurement sequencing and test integration