Keysight (Agilent) E5501A Phase Noise Measurement Solution, 50 kHz to 1.6 GHz

The Keysight (Agilent) E5501A Phase Noise Measurement Solution characterizes phase noise across 50 kHz to 1.6 GHz with rapid, accurate measurements suitable for ATE systems and R&D benchtop applications. It delivers sensitivity and employs phase detector techniques - reference-source/PLL or frequency-discriminator methods with analog delay line - to achieve high repeatability and measurement integrity across one-port devices.

Technical Specifications

• Frequency Range: 50 kHz to 1.6 GHz


• Offset Frequency Range: 0.01 Hz to 4 MHz (A-series standard)


• System Noise Response: Typically –180 dBc/Hz at offsets >10 kHz


• System Spurious Response: Typically –120 dBc


• Measurement Speed: Test times <3 seconds (1 kHz to 100 kHz offset) or <30 seconds (10 Hz to 1 MHz offset) for A-series


• Sensitivity:

Key Features

• Phase noise and AM noise measurements on single platform


• Fast measurement capability enables rapid device characterization


• Integrated measurement software with PC control


• Low-noise frequency downconverters included


• RF spectrum analyzer integration


• Optional reference signal sources via Keysight 8662A/8663A/8643A/8644B/8664A/B/8665A generators

Typical Applications

• One-port voltage-controlled oscillators (VCOs)


• Dielectric resonator oscillators (DROs)


• Crystal oscillators


• Synthesizer characterization


• Automated test equipment phase noise screening


• R&D oscillator development and validation

Compatibility & Integration The E5501A integrates into existing ATE systems with quick deployment on R&D benchtops. It accepts low-noise reference signals from standard Keysight signal generators, enabling flexible test architecture and multi-instrument measurement campaigns.