JTAG Technologies JT3707/TSI DataBlaster Boundary-Scan Controller
JTAG Technologies Embedded Test Systems.
- Model
- JTAG Technologies JT3707/TSI
- Calibration
- Available on request
- Price
- $2,400
- Status
- In stock
- RFQ ref
- JT3707/TSI
This unit
The JTAG Technologies JT3707/TSI DataBlaster is a boundary-scan controller for IEEE 1149.1 testing and in-system programming (ISP). It delivers sustained test clock speeds to 40 MHz with programmable TCK adjustment from 500 Hz to maximum, enabling flexible performance tuning for complex, high-density PCBs. The triple-serial interface (TSI) provides USB 2.0 (480 Mbit/s), USB 1.1 (12 Mbit/s), Ethernet, and FireWire (IEEE-1394-1995 and IEEE-1394A-2000) connectivity at 100, 200, and 400 Mbit/s operation, supporting integration across diverse computing platforms.
Technical Specifications Core Capability: IEEE 1149.1 boundary-scan testing and in-system flash programming Test Clock (TCK): 40 MHz sustained; programmable from 500 Hz to maximum; automatic speed matching for optimal chain performance Connectivity Interfaces:
USB 2.0 at 480 Mbit/s and USB 1.1 at 12 Mbit/s
Ethernet
FireWire (IEEE-1394-1995 and IEEE-1394A-2000) at 100, 200, and 400 Mbit/s TAP Architecture: Four synchronized test access ports via included JT 2147 QuadPOD system; each TAP pod (JT 2149) features a 20-way TAP connector and eight-pin connector for four static I/O lines TAP Voltage Range: 1.0 V to 3.6 V, individually programmable per TAP Flash Memory Buffer: Expandable up to 128 Mbits QuadPOD System (JT 2147): Bench-top signal conditioning module comprising JT 2148 transceiver and four removable JT 2149 TAP pods, connected via 50-way shielded cable assembly
Key Features
Scalable architecture upgradeable to JT3717 with JT 2108 ETT (Enhanced Throughput Technology) module
Optimized binary file format (BSX) for high-speed execution
Optional SCIL measurement modules and JT 2149/DAF (Digital/Analog/Frequency) modules for expanded capability
Full compatibility with existing JTAG Technologies test and ISP files
Typical Applications Board testing, CPLD programming, fast in-system flash memory programming, vector-intensive manufacturing test, and engineering environments with small-to-large data block requirements
Compatibility & Integration Fully compatible with existing JTAG Technologies test and ISP file libraries. Low-voltage TAP system supports modern embedded and FPGA device ecosystems.
Specifications
| Parameter | Value |
|---|---|
| Frequency Range | 40 MHz (test clock) | Voltage / Current Range: 1.0 V to 3.6 V (TAP voltage) |
JTAG Technologies JT3707/TSI — Repair & Calibration Service
Aumictech offers NIST-traceable calibration and repair for the JTAG Technologies JT3707/TSI. Calibration covers analog input channel accuracy and offset at all gain settings, analog output accuracy, digital I/O logic threshold verification, sample rate and timing accuracy, and trigger and synchronization bus functional verification. NI CompactRIO and PXI chassis also undergo backplane trigger line integrity check.. All calibrations ship with a NIST-traceable certificate. Turnaround is typically 1–3 business days after receipt.
Common JTAG Technologies JT3707/TSI faults: power supply failure (cRIO-9073/9074), C-series slot connector wear, PXI chassis fan failure, GPIB interface failure on VXI controllers, BIOS/EEPROM corruption. NI CompactRIO most common faults are power supply failure on older cRIO-9073/9074 chassis and C-series module slot connector wear from repeated hot-swap cycles. PXI chassis fan failure is the most common wear item — chassis fans are field-replaceable. VXI embedded controllers most commonly develop EEPROM corruption and GPIB interface failure.
JTAG Technologies JT3707/TSI price
This JTAG Technologies JT3707/TSI is listed at $2,400. Calibration is available separately from $450. Contact us for volume pricing or if you need multiple units.
JTAG Technologies JT3707/TSI calibration cost
NIST-traceable calibration for the JTAG Technologies JT3707/TSI is $450 (standard — pass/fail certificate and calibration sticker) or $650 (full measured data at every test point, reference standards documented, traceability chain included). Calibration for this instrument covers analog input channel accuracy and offset at all gain settings, analog output accuracy, digital I/O logic threshold verification, sample rate and timing accuracy, and trigger and synchronization bus functional verification. NI CompactRIO and PXI chassis also undergo backplane trigger line integrity check.. Turnaround is 1 to 3 business days after receipt. See full calibration details →
