Tektronix MDO4104B Mixed Domain Oscilloscope

The Tektronix MDO4104B is a mixed-domain oscilloscope that combines analog, digital, and RF signal analysis in a single instrument. It delivers 1 GHz analog bandwidth across four channels, 16 digital channels for logic state capture, and a spectrum analyzer covering 9 kHz to 6 GHz. Time-correlated measurements across all domains enable simultaneous time and frequency domain visibility, accelerating debug cycles on complex embedded systems.

Technical Specifications

Analog Channels: 4 channels at 1 GHz bandwidth, 5 GS/s sample rate (single or dual channel), 2.5 GS/s (four channels), 20 M point record length, 350 ps rise time. Input impedance rated for standard passive voltage probes with 3.9 pF capacitive loading. Digital Channels: 16 channels with 500 MS/s main acquisition and 20 M point record length. MagniVu acquisition reaches 16.5 GS/s with 10,000 point record length centered on trigger and 60.6 ps timing resolution. Per-channel thresholds support TTL, CMOS, ECL, PECL, or user-defined modes (±40 V range). Threshold accuracy is ±[100 mV + 3% of setting]. Maximum input toggle rate is 500 MHz; minimum detectable pulse width is 1 ns. Input dynamic range is 30 Vp-p (≤200 MHz) and 10 Vp-p (>200 MHz). Minimum voltage swing is 400 mV. Channel-to-channel skew measures 200 ps typical. Maximum input voltage is ±42 Vpeak. Spectrum Analyzer: 9 kHz to 6 GHz frequency range with ≥1 GHz ultra-wide capture bandwidth. Trace types include Normal, Average, Max Hold, and Min Hold. Detection modes cover +Peak, -Peak, Average, and Sample. Automated measurements include Channel Power and Adjacent Channel Power Ratio. Display: 264 mm (10.4 inch) XGA color display.

Key Features

• Time-correlated analysis across analog, digital, and RF domains


• Advanced per-channel digital thresholds with multiple logic family selections


• MagniVu high-resolution timing captures to 16.5 GS/s


• RF spectrum visibility to 6 GHz with ≥1 GHz capture bandwidth


• Automated RF power and adjacent channel measurements

Typical Applications

• Embedded system debug and signal integrity analysis


• RF and mixed-signal circuit characterization


• Digital protocol and timing verification


• Multi-domain event correlation