Interface Technology SR5010 Timing / Control Module

The Interface Technology SR5010 is a timing and control module for the SR5000 Digital Test Subsystem, delivering precise timing signals and real-time test sequence control at data rates up to 50 MHz. Built on a dual-processor architecture, the System Processor manages VXI Bus messaging and SCPI command execution, while the Control Processor operates as the real-time digital test engine, handling conditional branching, looping, and logic analysis trigger evaluation. ## Technical Specifications • Data Rate: Up to 50 MHz • Processors: Dual-processor architecture (System Processor and Control Processor) • Test Program Storage: 32 different test programs • Vector Depth: 64K vectors • I/O Expandability: Up to 640 Inputs and 640 Outputs • Power Requirements: - +5.0 V @ 5.5 A (27.5 W) - -5.2 V @ 0.8 A (4.16 W) - +12 V @ 0.2 A (2.40 W) - -12 V @ 0.2 A (2.40 W) - -2.0 V @ 0.2 A (0.40 W)

Total Maximum: 36.86 W • VXI Bus Interface: IT9010M chipset; compliant with VXI Bus Specification Versions 1.3 and 1.4 • Data Transfer: A32/D32 Binary Transfer protocol ## Key Features • RAM-Backed and Algorithmic Pattern Generation modes • Programmable edge placement for data formatting precision • 16 Trigger Sequences with multilevel triggering capability • Response Qualifier Trigger Words supporting up to 8 combinations per sequence • Conditional pattern looping and branching for dynamic test control • Message-based command structure for streamlined test program development • Trigger actions select between UUT response data or compare error data recording ## Typical Applications Automatic test equipment (ATE) environments requiring synchronized device control, digital pattern generation with real-time branching logic, and advanced trigger-based data acquisition across large I/O matrices. ## Compatibility & Integration C-size slot module designed for SR5000 Digital Test Subsystem integration. Controls up to 20 SR5050 CMOS I/O modules, enabling configurations up to 640 I/O pins. VXI Bus Master capability passes test parameters and data to SR5000 I/O modules via message-based command protocol.