Keysight (Agilent) 1741A Dual Channel Storage Scope, 100 MHz

The Keysight (Agilent) 1741A is a dual-channel, 100 MHz storage oscilloscope engineered for capture and analysis of transient and infrequent electronic signals. The instrument combines two independent input channels with CRT-based waveform visualization and variable persistence storage, enabling detailed examination of signal behavior across time. Dual-mode triggering - internal and external - supports signals from DC through 100 MHz, making it suitable for general-purpose analog circuit debugging, signal characterization, and timing analysis in laboratory and field environments.

Technical Specifications

• Bandwidth: 100 MHz


• Channels: 2 (Channel A, Channel B)


• Display: Cathode Ray Tube (CRT)


• Vertical Sensitivity: 1 mV/div to 30 MHz; 5 mV/div to 20 V/div over 12 deflection factors; accuracy within 3%


• Bandwidth Limit: Approximately 20 MHz on both channels


• Horizontal Sweep Rates: 2 s/div to 0.005 µs/div; 10X magnifier extends fastest rate to 5 ns/div


• Input Impedance: Selectable 50 Ω (DC coupled) or 1 MΩ shunted by 20 pF


• Coupling Options: AC (–3 dB at 10 Hz), DC, GND, 50 Ω


• Internal Trigger Sensitivity: 0.3 div at DC–25 MHz; 1 div at 100 MHz


• External Trigger Input: 50 mV p-p (DC–50 MHz) or 100 mV p-p (100 MHz); 1 MΩ || 20 pF impedance; 250 V DC + peak AC or 500 V p-p (AC, ≤1 kHz) maximum


• Storage and Persistence: Variable persistence with manual erase; brightness control affects write rate and store time


• Calibration Output: 1 V p-p (±1%) square wave at 1.4 kHz; 100 mV p-p when terminated in 50 Ω

Key Features

• Storage mesh allows capture of single-shot and low-repetition-rate events


• Selectable signal view: Channel A, Channel B, and Trigger in alternate and chop modes


• Manual ERASE function; CONV. indicator shows conventional oscilloscope mode override


• External trigger with BNC connector and high voltage rating


• Front-panel chassis ground connection

Typical Applications Transient signal capture, pulse characterization, timing verification, circuit debugging, and analog signal analysis in development and service environments.