Agilent/Keysight A400GE-QDD

The Keysight A400GE-QDD is a compact test system for validating Bit Error Rate (BER) and Forward Error Correction (FEC) performance in 400 Gigabit Ethernet electronics. Designed for engineers qualifying 400GE chips, optical transceivers, and port electronics, it delivers real-time BER and FEC statistics across all lanes simultaneously. The system measures performance in minutes rather than hours, enabling rapid identification of bursty and thermal errors through detailed KP4 FEC analysis.

Technical Specifications

• 400GE Interface Support: 8x56 Gb/s electrical interface with PAM4 encoding; IEEE 802.3bs and IEEE 802.3cd compliant


• Speed Configurations: 1x400GE, 2x200GE, 4x100GE, 8x50GE


• Latency Measurement Resolution: 0.625 ns at 400GE; 1.25 ns at 200GE


• Lane Signaling: 56 Gb/s electrical per port

Key Features

• Layer 1 BERT and KP4 FEC testing with real-time system-wide BER and FEC statistics across all lanes


• FEC codeword bit-error density distribution analysis for symbol error performance detail


• Detection of bursty and thermal errors over time through KP4 FEC symbol bit error distribution


• KiOS software - browser-based single-page application supported by Google Chrome for fast setup and PASS/FAIL reporting with user-defined tolerances

Compatibility & Integration

• Optical Transceivers: QSFP-DD MSA compliant; supports 400GBASE-DR4, 400GBASE-FR4, 400GBASE-SR8, and QSFP56


• Copper Media: 400GBASE-CR8 passive copper Direct Attached Cables up to 3 meters


• Optional Accessories: Host and module compliance boards, cables, and adapter bundles available for simplified integration with BERT analyzers and development boards