JDS Uniphase BROADBAND SOURCE model BBS1550+2FA30

The JDS Uniphase BBS1550+2FA30 is a C-band broadband light source engineered for fiber optic testing and measurement applications. It generates amplified spontaneous emission (ASE) across the 1527–1568 nm wavelength range, with optical gain flattening applied across 1529–1565 nm to deliver a stable, uniform spectral output. The instrument is deployed in manufacturing and R&D environments for optical component spectral characterization and systems compliance testing.

Classified as Class IIIb, the source operates from single-phase AC mains (100–240 V, 50–60 Hz) and delivers regulated output with ±0.02 dB power stability over one hour at 23 °C following warm-up. The benchtop half-rack form factor measures 21.2 × 8.9 × 35.5 cm and weighs under 4 kg; optional 19-inch rack-mount integration is available. Safety compliance includes FDA 21CFR 1040.10 and IEC 60825-1 (2002).

Technical Specifications

• Wavelength Range: 1527–1568 nm (C-band)


• Gain Flattened Range: 1529–1565 nm


• Spectral Gain Flatness: ≤1.6 dB maximum


• Total Optical Power: >50 mW minimum; maximum 180 mW (FDA 21CFR 1040.10 compliant)


• Output Power Stability: ±0.02 dB over one hour at 23 °C (post warm-up)


• Output Isolation: ≥45 dB


• Output Connector Options: FC/PC, FC/APC, SC/PC, SC/APC


• Laser Classification: Class IIIb


• Power Consumption: 90 VA maximum


• Mains Input: 100–240 V AC, 50–60 Hz, single-phase


• Operating Temperature: 0–50 °C


• Storage Temperature: −40–70 °C


• Humidity: ≤95% RH non-condensing (0–45 °C)


• Dimensions: 21.2 W × 8.9 H × 35.5 D cm


• Weight: <4 kg

Key Features

• Gain-flattened ASE output ensures uniform spectral response


• Tight output power stability for repeatable measurements


• High output isolation minimizes back-reflections


• Compact benchtop design with optional rack-mount configuration


• Dual safety compliance (FDA and IEC standards)

Typical Applications

• Optical component spectral measurement


• Systems compliance testing


• Optical measurement systems


• Sensor and imaging applications

Compatibility & Integration Multiple connector options (FC and SC variants, PC and APC polished finishes) enable direct integration into diverse optical test benches and automated measurement platforms.