Exfo FPMD-5600 Femtosecond PMD Analyzer

The Exfo FPMD-5600 Femtosecond PMD Analyzer is a precision instrument for measuring polarization mode dispersion (PMD) in optical fiber systems. It employs femtosecond laser technology and Fourier-transform-based Interferometric (FPI) analysis - mathematically equivalent to Jones Matrix Eigenanalysis and approved by ITU, IEC, and TIA standards - to characterize PMD down to the femtosecond range. Essential for high-speed optical networks (10, 40, and 100 Gbit/s), the analyzer measures all Stokes parameters (s0, s1, s2, s3) and differential group delay as a function of wavelength or frequency. Its design minimizes environmental sensitivity to stress and temperature variations, delivering unbiased results even in production floor environments.

Technical Specifications

PMD Measurement Range: Down to femtosecond range

Stokes Parameters: Complete characterization of s0, s1, s2, s3

Wavelength Range (Standard Calibration): 1530 nm to 1600 nm; custom ranges available

Spectral Resolution: 0.03 nm over C+L-band

DUT Gain/Attenuation Support: +25 dB gain to −45 dB attenuation

Measurement Accuracy: <0.5% variation (verified against NIST standard, 372 fs PMD artifact)

Key Features

Broadband non-polarized ASE source integrated

Polarization synthesizer (0°, 45°, 90°) for complete state generation

Fourier transform spectrum analyzer with dedicated polarimeter

FPI technique based on Poincaré Sphere Analysis

Plug-and-measure routine for rapid deployment

Customizable user profiles

Handles composite systems with gain, attenuation, and filtering

Typical Applications

High-speed optical network characterization and validation

Fiber manufacturing quality control and process optimization

PMD artefact and standard verification

Polarization state analysis across C+L-band wavelengths

Compatibility & Integration Fully compatible with ITU, IEC, and TIA standard measurement methodologies. Accepts Devices Under Test with integrated ASE source coupling. Standard operation within 1530–1600 nm; measurement outside calibration range may produce erroneous results.