JDS Uniphase MAPA+2329190SC

The JDS Uniphase MAPA+2329190SC is a hot-swappable optical test and measurement cassette within the Multiple Application Platform (MAP) series. This modular component integrates into MAP chassis platforms to deliver optical signal processing without requiring system downtime. The MAP architecture supports dynamic reconfiguration across amplification, attenuation, modulation, switching, filtering, and detection functions, making it suitable for evolving laboratory and production test environments in optical communications.

Technical Specifications

Platform Compatibility: Integrates with JDS Uniphase MAP Master (MAP+2M00) or MAP Benchtop (MAP+2B00) chassis via hot-swappable backplane

Modularity: Hot-swappable cassette format - replacement or addition without power cycling

Wavelength Range: Depends on specific cassette function; typical ranges include C-band (1527 to 1563 nm), L-band (1563 to 1610 nm), or broadband (1200 to 1700 nm)

Connector Types: FC/PC, FC/APC, SC/PC, SC/APC support

Operating Temperature: 0 to 50 °C

Storage Temperature: -30 to 60 °C

Humidity: Less than 80% RH, non-condensing

Control Interface: RS-232 and GPIB remote communication ports

Key Features The MAP cassette family encompasses multiple function types: EDFA modules with saturated output power from 14 dBm to 21 dBm and noise figures as low as 3.3 dB with gain flatness better than 1.4 dB for C- or L-band operation. Programmable attenuators provide attenuation ranges up to 60 dB with 0.01 dB resolution across 1200 to 1700 nm. Dual Parallel Mach-Zehnder (DPMZ) modulators support 20 GHz frequency range for multi-symbol modulation schemes. Tunable bandpass filters enable continuous wavelength tuning across specified ranges (e.g., 1420 to 1630 nm). Optical switch configurations (1x4, 2x1x12) deliver low insertion loss and high return loss. ASE and laser light sources, plus optical detector modules, complete the function set.

Compatibility & Integration The MAPA+2329190SC operates within the unified MAP ecosystem, sharing a common control platform, color display interface, and backplane architecture. This design enables field-configurable system builds tailored to specific measurement workflows.