Agilent/Keysight P5023B

The Keysight P5023B Streamline Series is a PC-based Vector Network Analyzer delivering S-parameter measurements across 9 kHz to 14 GHz with 142 dB dynamic range. Available in 4-port or 6-port configurations, it connects via Thunderbolt 3 for high-speed data transfer and operates with 50 Ω impedance. The compact, lightweight design enables single-handed portability across test locations and teams.

Technical Specifications

• Frequency range: 9 kHz to 14 GHz


• Port configurations: 4-port (Option 400) or 6-port (Option 600)


• Optional second source available for 4-port models (Option 402) for intermodulation distortion measurements


• Interface: Thunderbolt 3 (USB Type-C)


• Dynamic range: 142 dB


• Input impedance: 50 Ω


• Sweep modes: Linear, Log, Segment, CW, Power, DC source


• No internal data storage memory

Key Features

• Fast, reliable, and repeatable measurements with trace noise and temperature stability


• Direct Receiver Access (DRA) configuration support


• Full N-port calibration for systems exceeding 4 ports


• Cascadable with additional VNAs to extend test port count


• Compatible with Keysight Electronic Calibration (ECal) modules


• Shares GUI, SCPI commands, and measurement algorithms with established Keysight VNAs


• Faceless design minimizes footprint for space-constrained environments

Measurement Capabilities The P5023B supports pulsed-RF analysis, automatic fixture removal, time-domain reflectometry (TDR), noise figure measurements with vector correction, embedded local oscillator operation, gain compression analysis, spectrum analysis, and multiport calibrated measurements. With Option 402, intermodulation distortion (IMD) characterization becomes available.

Compatibility & Integration As a PC-based instrument, the P5023B integrates into existing measurement workflows through standard SCPI command support and a familiar graphical interface. The absence of internal storage makes it suitable for classified laboratory environments. Hardware upgrades extend measurement capabilities without requiring instrument replacement.