Agilent/Keysight R347B

The Agilent/Keysight R347B is a millimeter-wave noise source engineered for R-band applications spanning 26.5 to 40 GHz. This calibrated noise generator delivers precise broadband noise signals required for accurate noise figure measurements in millimeter-wave systems and components. The source operates via +28 V DC excitation and produces two distinct noise states - powered and thermal - enabling direct gain and noise characterization of devices under test when paired with compatible noise figure meters or analyzers.

Technical Specifications

• Frequency Range: 26.5 to 40 GHz


• Excess Noise Ratio (ENR): 10 to 13 dB


• Output Connector: R-band waveguide G-599/U flange


• Bias Connector: BNC (female)


• Power Supply: 28 V ±1 V DC (integrated with 8970B meter)


• Maximum Reverse Power: 100 mW


• Source Impedance Match (SWR): <1.42 (source off), <1.31 (source on)


• ENR Stability: <0.005 dB/V over voltage; <0.009 dB/°C over temperature


• Switching Speed: <10 μs


• Operating Temperature: 0 to 55 °C


• Physical Dimensions: 52 mm × 108 mm × 60 mm


• Weight: 0.21 kg (net); 0.36 kg (shipping)

Key Features

• Exceptional ENR stability supporting extended recalibration intervals


• Minimal SWR across the millimeter-wave band ensures accurate source characterization


• Rapid switching enables efficient noise figure workflows


• Compact form factor integrates directly into benchtop measurement systems

Typical Applications

• Noise figure characterization of low-noise amplifiers (LNAs) and RF front-end modules


• System-level noise performance validation in satellite and millimeter-wave communication systems


• Component qualification and acceptance testing in aerospace and defense programs


• R&D verification of wideband millimeter-wave receiver designs

Compatibility & Integration The R347B connects directly to the Agilent 8970B or Keysight 8970B Noise Figure Meter, which supplies bias power automatically. Integration with Keysight NFA and X-Series (PXA, MXA) analyzers extends measurement capability to systems-level characterization workflows.