Keithley System 40

The Keithley System 40 is a modular test and measurement platform engineered for automated testing and high-volume data acquisition. Its plug-in card architecture enables rapid configuration for diverse switching, multiplexing, and signal routing applications across temperature measurement, device power control, and RF/microwave environments. The system supports relay-based switching with onboard memory storage, two- or four-wire measurement capability, and isolated switching options with exceptionally low contact potential.

Technical Specifications

Multiplexer Module (7702/7702-AU):

• 40-channel differential switching: 2-pole or 20-channel 4-pole configuration


• Two independent multiplexer banks supported


• Two protected current measurement channels


• Voltage channels: 300 V, 1 A (60 W, 125 VA)


• Current channels: 3 A capacity


• Two- or four-wire measurement modes


• Screw terminal connections Scanner Card (7705):


• 40-channel independent switching, 1-pole Form A


• 300 V, 2 A capacity


• 50-pin female D-sub connectors


• Relay closures stored in onboard memory Isolated Switch Card (7036):


• 40-channel independent 1-pole Form A switching


• 1 A switch rating


• <100 pA offset current


• <4 µV contact potential


• 96-pin mass terminated connector RF/Microwave Routing (40-C203 with F Module):


• Modular RF/microwave signal routing capability


• Customer-configurable architecture

Key Features

• Modular plug-in card design for flexible system expansion


• Relay closure memory for sequence automation


• Ultra-low leakage current and contact potential in isolated switching paths


• Multiple connector options: screw terminals, D-sub, and mass-terminated interfaces

Typical Applications

• Temperature measurement systems (RTD, thermistor, thermocouple)


• Automated device power and load switching


• RF/microwave signal path selection


• Portable device test automation


• High-channel-count data acquisition

Compatibility & Integration The System 40 accommodates diverse measurement modules within a single chassis, supporting parallel operation of multiplexing, scanning, and switching functions. Relay memory storage enables programmed test sequences without external sequencing logic.