Keysight / Agilent / HP 3577A and 35677B Network Analyzer and S-Parameter Test Set

The Keysight/Agilent/HP 3577A Network Analyzer paired with the 35677B S-Parameter Test Set delivers precision impedance and S-parameter measurements from 5 Hz to 200 MHz. This dual-unit system excels in design and production environments, characterizing two-port devices with high speed and accuracy. The 3577A employs individual precision analog receivers for each input, eliminating signal multiplexing to preserve measurement integrity. Both units are fully programmable via HP-IB (IEEE 488), enabling automated test sequences and seamless integration into larger measurement systems.

Technical Specifications Keysight/Agilent/HP 3577A Network Analyzer:

Frequency Range: 5 Hz to 200 MHz

Frequency Resolution: 0.001 Hz

Output Power: 0 dBm

Dynamic Range: Greater than 130 dB (with noise reduction)

Receiver Input Impedances: 50 Ω or 1 MΩ (selectable)

Measurement Resolution: 0.001 dB, 0.005 degrees, 1 ps

Display Modes: Magnitude, phase, polar, real, imaginary, group delay

Error Correction: Three-term vector error correction and normalization

Noise Reduction: Vector noise averaging with selectable resolution bandwidth filters

External Reference: 10 MHz input/output (BNC, rear panel)

External Trigger: TTL or contact closure (BNC, rear panel)

Storage: Non-volatile memory for five front-panel setups

Power: 115 V or 230 V, 47–440 Hz, 450 VA maximum

Dimensions: 222 mm H × 426 mm W × 578 mm D

Weight: 31 kg (net) Keysight/Agilent/HP 35677B S-Parameter Test Set:

System Compatibility: HP 3577A Network Analyzer

Frequency Range: 100 kHz to 200 MHz

Test Port Impedance: 75 Ω

Directivity: >40 dB

Frequency Response (S21, S12): ±1 dB, ±5 degrees

Key Features

Vector error correction and normalization minimize systematic errors

Binary or ASCII data transfer via HP-IB for fast automated workflows

HP-GL graphics plotter control for direct output integration

Dual-receiver architecture eliminates multiplexing losses

Selectable impedance matching (50 Ω or high-impedance modes)

Group delay, insertion loss, return loss, and reflection coefficient measurement

Typical Applications Filter and amplifier characterization, transmission line analysis, device impedance profiling, gain compression testing, and phase distortion measurement across baseband to VHF frequencies.

Compatibility & Integration HP-IB programming enables remote control and data acquisition. External 10 MHz reference input supports phase-locked system operation. TTL trigger input synchronizes measurements with external test sequences.