Anritsu 37297E Passive Vector Network Analyzer, 40 MHz – 65 GHz

The Anritsu 37297E is a passive vector network analyzer designed for S-parameter characterization from 40 MHz to 65 GHz. It delivers high dynamic range measurements - up to 142 dB at 2.5 GHz and 125 dB at 65 GHz - making it suitable for on-wafer and coaxial device testing across defense, satellite, radar, broadband communications, and optoelectronic applications.

Technical Specifications

Frequency Range: 40 MHz to 65 GHz Measurement Parameters: S11, S21, S22, S12, and user-defined combinations of a1, a2, b1, and b2 Measurement Domains: Frequency domain, CW draw, and optional high-speed time/distance domain Display: 8.5-inch color LCD with four independent channels; up to eight traces displayed simultaneously (maximum two traces per channel). Channels 1 and 3, or channels 2 and 4 may be overlaid. Separate trace memory available per channel for data storage and arithmetic operations. Data Points: 1601 maximum; user-selectable from 2 to 1601 discrete points Graph Types: Log magnitude, phase, log magnitude and phase, Smith chart (impedance and admittance), linear polar, log polar, group delay, linear magnitude, linear magnitude and phase, real, imaginary, real and imaginary, SWR, and power out

Key Features

• Dynamic Range: Up to 142 dB at 2.5 GHz; 125 dB at 65 GHz


• Dual Source Control: Independent control of two sources for mixer, multiplier, and frequency-translated device testing


• Power Meter Correction: Calibrates flat, leveled output power across full frequency sweep


• Advanced Calibration: SOLT, offset short, waveguide, and metrology-grade multiple line LRL/LRM methods; adapter removal calibration for non-insertable devices

Typical Applications

• Swept power or frequency gain compression on amplifiers


• Direct frequency translation measurements on mixers via NxN multidevice utility


• Balanced and differential device testing with optional multiport test set


• E/O and O/E optoelectronic characterization with de-embedding and photo detector transfer function analysis


• Fixture and device embedding/de-embedding through S2P network manipulation

Compatibility & Integration Supports multiport test set integration for extended measurement capabilities on complex device topologies.