Agilent/Keysight 6237A DC Power Supply

The Agilent/Keysight 6237A is a triple-output DC power supply engineered for electronic circuit development, component testing, and IC powering applications. Three independent outputs deliver adjustable voltage and current with low noise and exceptional regulation. Each output operates under fixed current limiting protection, making the unit suitable for developmental and production bench work requiring stable, precision DC power.

Technical Specifications

• Output 1: 0 to +18 V, 0 to 1 A


• Output 2: 0 to +20 V, 0 to 0.5 A


• Output 3: 0 to -20 V, 0 to 0.5 A


• ±20 V outputs track within 1% Regulation & Performance


• Line and Load Regulation (CV): Less than 0.01% + 2 mV


• Line and Load Regulation (CC): Less than 0.02% + 2 mA


• Short Circuit Output Current (±20 V outputs): 0.55 A ±5%


• Short Circuit Output Current (+18 V output): 1.1 A ±5%


• Fixed Current Limits: +18 V at 1.1 A; ±20 V at 0.5 A Input Power


• Voltage: 104 to 127 V AC, single-phase


• Frequency: 47 to 63 Hz


• Power Consumption: 112 W, 140 VA

Key Features

• Three independent outputs with isolated common terminal for +18 V and ±20 V supplies


• Two single-turn potentiometers control voltage on +18 V and ±20 V outputs


• Dual-range meters display voltage and current; three-position selector switch isolates supply metering


• Fixed current limiting on all outputs protects against overload and short-circuit conditions


• Low output impedance supports multi-wire load connections to minimize coupling effects


• Compact bench-top form factor; approximately 10 lbs

Typical Applications

• Linear and digital IC circuit development and powering


• Electronic component characterization and testing


• Laboratory bench power for multi-rail applications

Compatibility & Integration The unit connects via separate wire pairs to each load to exploit low output impedance and reduce inter-channel coupling. Output terminals remain isolated from chassis ground, enabling flexible grounding configurations in test setups.