Agilent/Keysight 71612A – Bit Error Rate Tester

The Agilent/Keysight 71612A is a high-speed bit error rate tester engineered for characterizing optical and electrical signals from 1 to 12 Gb/s. Operating as an error performance analyzer, it delivers pattern generation, error detection, and measurement capabilities across SONET, SDH, and custom digital communication systems. The instrument supports Pseudo-Random Binary Sequences (PRBS) up to 2^31 - 1, user-defined patterns to 8 Mbit via disk, and variable mark density configurations for STM-64 and STS-192 testing.

An optional clock-source extension enables operation down to 100 Mb/s.

Technical Specifications

• Bit Rate: 1 to 12 Gb/s (optional 100 Mb/s to 12 Gb/s)


• Pattern Generator & Error Detector: 100 MHz to 12 GHz


• Test Patterns: PRBS sequences (2^31-1, 2^23-1, 2^15-1, 2^10-1, 2^7-1); zero substitution (2^13, 2^11, 2^10, 2^7); variable mark density on 2^13, 2^11, 2^10, 2^7


• Output Amplitude: 0.5 V to 2 V p-p in 10 mV steps; range +1.5 V to -3.0 V in 10 mV steps


• Output Transition Time (10% to 90%): <30 ps typical


• Output Jitter: <20 ps p-p (<15 ps p-p at 10 Gb/s)


• Input Sensitivity: <200 mV p-p typical at 10 Gb/s; <50 mV p-p typical for 2^23-1 PRBS at 10 Gb/s with 0 V high level; <100 mV @ 10 Gb/s


• Decision Threshold Range: +1 V to -3 V in 1 mV steps


• Clock/Data Phase Alignment: ±1 ns (100 MHz to 500 MHz); 1 clock period (500 MHz to 12 GHz)


• Clock/Data Delay Resolution: 1 ps


• Error Output: 0 to -0.4 V nominal


• Measurement Period: 1 s to 100 days; error thresholds of 10, 100, 1000 errors; bit counts 10^7 to 10^15

Key Features

• Error count, ratio, and interval measurements


• G.821 analysis and errored/error-free interval reporting


• Eye width and height characterization


• Error Location Analysis (ELA) for pattern-dependent error diagnosis


• Complementary, DC-coupled 50 ohm outputs (NRZ, normal or inverted)


• Quad sub-rate and quarter-rate data outputs


• Pattern inhibit input on error detector


• Memory sufficient for multiple SONET and SDH frames at OC-192/STM-64

Typical Applications

• R&D and manufacturing validation of lightwave components and sub-assemblies


• Advanced computer technology testing


• High-capacity communication systems characterization


• SONET and SDH frame analysis

Compatibility & Integration Accepts user-defined patterns via 3.5-inch disk in MS-DOS format. Clock and data inputs available on error detector.