Agilent/Keysight 75000 – Modular System Platform

The Agilent/Keysight 75000 Series is a modular system platform engineered for precision electronic test and measurement applications. Built on VXIbus and AXIe architectures, it delivers flexible multi-instrument configurations through an augmented local bus for inter-slot communication, synchronization, and module-to-module data movement. The platform scales horizontally or vertically, integrates via PCIe and LAN interfaces, and functions as a virtual PXI or benchtop instrument.

Engineers configure the 75000 for applications spanning atomic force microscopy to precision current-voltage analysis, leveraging advanced timing and triggering capabilities across diverse measurement domains.

Technical Specifications

• VXIbus and AXIe platforms available


• Augmented local bus for inter-slot communication and synchronization


• PCIe and LAN interfaces for remote operation


• Horizontal or vertical configuration options AFM Module (7500 AFM)


• XY scan range: 90 µm


• Z scan range: 12 µm


• XY positioning noise (closed-loop): < 0.15 nm typical


• Z noise level: < 0.03 nm


• XY linearity: < 0.5%


• Out-of-plane travel: < 0.1% full range


• Laser wavelength: 650 nm


• Video camera: 2 M pixel color, 1.7 µm resolution


• Sample stage manual travel (XY): ~10 mm; motorized (Z): ~10 mm


• Maximum sample diameter: ~25 mm; maximum height: ~8 mm


• Standard modes: Contact, LFM, AAC, Phase, CS-AFM, MFM, EFM, KFM, Liftmode, F-d Spectroscopy, F-V Spectroscopy, Force Modulation, Q-Control, LV PFM


• Optional modes: MAC, STM, PicoTREC, DLFM, Nanolithography, Electrochemistry, Heating/Cooling, Thermal K, PicoScript


• STM scanner available for pico-ampere and sub-pico-ampere current imaging Precision IV Analysis Module


• Current measurement capability: 0.1 fA minimum


• Configurable SMU modules: up to 8 or 10 slots


• Measurement types: IV, CV, pulse/dynamic IV


• Integrated analysis without programming

Key Features

• Patented top-down tip scanner technology for AFM


• PEEK polymer or stainless steel nose cones


• Advanced timing, triggering, and synchronization across modules


• Scalable current measurement from 0.1 fA

Typical Applications Atomic force microscopy, nanoscale characterization, current-voltage analysis, multi-parameter device testing.

Compatibility & Integration Operates as virtual PXI or benchtop instrument via PCIe and LAN; EasyEXPERT group+ software available.