HP / Agilent 8012A PULSE GENERATOR

The HP/Agilent 8012A Pulse Generator delivers precise, programmable pulse generation across a wide frequency range, making it essential for circuit characterization, signal integrity testing, and time-domain analysis. Engineers rely on this instrument for its independent control of pulse width, rise/fall times, and repetition rate - all with exceptionally low jitter. The 8012A supports external triggering, synchronous gating, and cascade operation, enabling complex test sequences and multi-instrument synchronization.

Technical Specifications Pulse Generation

Repetition Rate: 1 Hz to 50 MHz in four ranges with vernier adjustment

Pulse Width: 75% from 1 Hz to 10 MHz; 40% at 50 MHz

Period Jitter: <0.1% + 50 ps on any repetition rate

Width Jitter: 30 ns): <5% maximum deviation (10–90% points)

Overshoot/Ringing: <±5% of pulse amplitude

Preshoot: 1.5 Vpp or pulses >0.8V, minimum 7 ns wide

Trigger Output: >+1V across 50Ω; 16 ns ± 10 ns width

Trigger Polarity Delay: 25 ns ± 8 ns

Gate Input: DC-coupled; ~1600Ω impedance; TTL compatible; enables at >+1.5V or >3000Ω to ground

External Triggering: 0 to 50 MHz repetition rate

Synchronous Gating: Output pulses phase-aligned with gate leading edge

Key Features

Four independent ranges for repetition rate and pulse width with vernier fine-tuning

Minimal jitter specification ensures signal fidelity in high-speed testing

Asymmetrical rise/fall time control with 100:1 ratio capability

TTL-compatible gate input for programmable pulse train control

Trigger output suitable for cascading multiple 8012A units

Independently adjustable DC offset across all amplitude settings

Typical Applications

Digital circuit testing and timing characterization

High-speed pulse response measurement

Device switching and transition analysis

Multi-unit synchronization in test systems

Pulse shaping and edge-rate studies

Compatibility & Integration The 8012A accepts both sinusoidal and TTL-level trigger signals, supports external gating for repeatable test sequences, and generates trigger outputs compatible with other 8012A units and standard test instruments. Gate input impedance and voltage thresholds follow TTL conventions, simplifying integration into automated test environments.