HP / Agilent 8018A 50 MBIT/S DATA GENERATOR, 2 CH X 1 KBIT

The HP/Agilent 8018A is a dual-channel serial data generator delivering programmable pattern generation up to 50 Mbits/s. With 2048 bits of total memory split into independent 1 Kbit channels, it produces clean 6 ns pulses in RZ/NRZ formats and supports PRBS sequences, custom patterns, and complex data link structures. The instrument provides variable output amplitude to 15 V into 50 Ω, TTL/ECL/CMOS logic compatibility, and flexible triggering across bit, word, frame, and manual modes. Channel A offers simultaneous normal and complement outputs; Channel B provides normal output. Jitter performance of 0.2% and overshoot/preshoot/ringing ≤ 10% (ECL ≤ 15%) ensure signal integrity in high-speed digital circuit testing. Synchronization outputs lock external instruments to specific data stream points. HP-IB control (Option 001) enables automated pattern loading and test sequencing. The compact 426 mm × 422 mm × 133 mm form factor operates on 100–240 Vrms and dissipates 230 V A maximum.

Technical Specifications

Data Rate: DC to 50 Mbits/s

Memory: 2048 bits total (1 Kbit per channel, dual-channel configuration)

Pulse Width: 6 ns

Output Amplitude: Variable to 15 V into 50 Ω

Output Impedance: Selectable 50 Ω or 1 kΩ

Jitter: 0.2% (internal bit rate)

Signal Quality: Overshoot/preshoot/ringing ≤ 10% (ECL ≤ 15%)

Operating Temperature: 0°C to 50°C

Power Supply: 100/120/220/240 Vrms ±5%, 48–440 Hz

Power Consumption: 230 V A maximum

Dimensions: 426 mm W × 422 mm D × 133 mm H

Weight: 12 kg net; 16 kg shipping

Key Features

PRBS pattern lengths: 511, 1023, 32767, and 1048575 bits

Programmable data patterns and preamble-data-postamble sequences

RZ/NRZ output format selection

Channel A: Normal and complement outputs; Channel B: Normal output

Multiple triggering modes: bit, word, frame, and manual

External clock, cycle, word trigger, first bit, and last bit inputs

Synchronization outputs for instrument locking

Continuous auto-cycling or single-sequence operation

HP-IB (IEEE 488) interface for remote pattern loading

Compatibility & Integration Output logic levels support TTL, CMOS, and ECL circuits. Selectable 50 Ω or 1 kΩ output impedance accommodates both terminated and unterminated test environments. External triggering and clock inputs integrate with automated test systems.