HP / Agilent 8133A Pulse Generator, 3 GHz

The HP/Agilent 8133A is a 3 GHz pulse generator engineered for high-speed digital and communications testing. It delivers precise, programmable control of pulse parameters - period, width, delay, amplitude, and transition times - with minimal jitter for signal integrity in demanding test scenarios. The instrument generates programmable data patterns and PRBS sequences, supporting eye diagram measurements and advanced characterization. IEEE 488.1/488.2 and SCPI compliance enable seamless integration into automated test systems.

Technical Specifications Frequency & Timing

Frequency range: 33 MHz to 3 GHz

Programmable period: 333 ps to 30 ns

Transition time (rise/fall): <100 ps typical, <60 ps

Jitter: 1 ps typical, <5 ps maximum

Internal timebase minimum: 33 MHz (all specs)

Operation down to 3 MHz (reduced capability)

External timebase divisors: 1, 2, 4, 8, 16, 32, 64 Output Characteristics

Output amplitude: 2 Vpp AC-coupled (Channel X); 50 mV to 2 V for LVDS

Output impedance: 50 Ω

Connectors: SMA (f) 3.5 mm

Programmable pulse width and delay

Programmable interchannel delay

Variable cross-over point for eye deformation simulation Data Generation (Option 002)

Data modes: 32-bit programmable patterns or PRBS

PRBS: CCITT O.151 (2^23-1)

Pattern types: NRZ and RZ (50% duty cycle)

Trigger output: Synchronized to Bit 0 of 32-bit word Configuration Options

Single or dual channel configurations available

Option 002: Pulse/Data Channel

Option 003: Pulse Channel

Non-volatile memory: Stores 20 complete instrument setups

Key Features

All modes and parameters fully programmable via GPIB

Jitter emulation capability for delay modulation testing

Transition times <100 ps ensure signal fidelity

Channel 2 minimum frequency: 1 MHz

Operates 0°C to 55°C

Typical Applications

High-speed digital circuit characterization

Eye diagram and timing analysis

Communications system testing

LVDS and differential signal validation

Compatibility & Integration Full GPIB programmability per IEEE 488.1/488.2 and SCPI 1992.0 standards. Settings stored in non-volatile memory across power cycles.