Agilent/Keysight 8570A

The Agilent/Keysight 8570A is a spectrum analyzer for signal analysis across 10 MHz to 22 GHz, extendable to 115 GHz with external mixers. It delivers precise measurement across signal monitoring, component testing, and EMI analysis with frequency spans from 1.7 to 22 GHz in multiband operation and per-division spans from 1 kHz to 500 MHz/div.

Technical Specifications

• Internal: 10 MHz to 22 GHz


• With optional external mixers: 40 GHz


• With 11971 series mixers: 71 GHz


• With commercially available mixers: 115 GHz Frequency Accuracy


• ±(9 MHz or 0.03% of center frequency, whichever is greater) + 20% of Frequency Span/Div


• Unstabilized (20 kHz to 500 MHz/div): ±5%


• Stabilized (1 kHz to 100 kHz/div): ±20% Resolution Bandwidth


• Range: 1 kHz to 3 MHz in 1, 3 sequence


• Accuracy: +20%


• Minimum: 1 kHz Amplitude Performance


• Displayed Average Noise Level: -110 dBm to -85 dBm


• Minimum Displayed Average Noise: -113 dBm


• Maximum Displayed Average Noise: -90 dBm


• Noise Sidebands: >70 dB down at 30 kHz offset


• Measurement Uncertainty: 0.15% maximum


• Maximum Safe AC Input: +30 dBm Sweep Characteristics


• Minimum Sweep Time: 2 µs


• Maximum Sweep Time: 10 s


• Total Residual FM: <200 Hz p-p in 0.1 sec (stabilized)

Key Features

• Digital storage display with on-screen switch setting readout


• Internal preselection for spurious-free measurement across wide dynamic range


• Coupled digital controls for rapid measurement routines


• Direct hard-copy output to digital plotter without external controller or programming


• HP-IB interface for semi-automatic operation with desktop computer


• Warranted performance after 5-minute warm-up; extended stability after 30-minute warm-up over 20 °C to 30 °C

Typical Applications

• Signal monitoring and component characterization


• Electromagnetic interference (EMI) analysis


• Multi-band spectrum measurement in single sweep

Compatibility & Integration HP-IB interface enables integration with desktop computing systems for semi-automated measurement routines and data acquisition.