Ando AQ4321D 1520-1620nm Tunable Laser Source

Ando Tunable Laser Sources. Resolution: 0.001 nm, Accuracy: ±10 pm (typ.) at 1520 nm, Accuracy: ±0.01 nm (typ.).

Model
Ando AQ4321D
Calibration
Available on request
Price
$6,779
Status
In stock
RFQ ref
AQ4321D
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This unit

The Ando AQ4321D is a high-precision tunable laser source engineered for DWDM system and component evaluation across the 1520–1620 nm band. It delivers stable, spectrally pure output with absolute wavelength calibration via internal gas cell absorption, enabling accurate characterization of optical devices without manual recalibration. Continuous wavelength tuning, high side-mode suppression, and synchronous sweep capability make it ideal for broadband optical testing and dynamic range measurements when paired with compatible spectrum analyzers.


Technical Specifications



  • Wavelength Range: 1520–1620 nm

  • Wavelength Resolution: 0.001 nm

  • Absolute Wavelength Accuracy: ±10 pm (typ.) at 1520 nm; ±15 pm or less (typ.)

  • Relative Wavelength Accuracy: ±0.01 nm (typ.)

  • Wavelength Stability: ±0.01 MHz/h or less (typ.); ±100 MHz/h (typ.)

  • Spectral Linewidth: 200 kHz (typ.); up to 200 MHz (typ.)

  • Optical Output Level: +7 dBm (typ.); peak output >7.5 dBm

  • Output Level Flatness: ±0.1 dB across 1540–1600 nm

  • Optical Output Stability: ±0.01 dB; 0.05 dB or less

  • Optical Output Reproducibility: ±0.04 dB (typ.)

  • Side Mode Suppression Ratio (SMSR): 60 dB (typ.); 50 dB or more

  • Wavelength Sweep Speed: 100 nm/sec (max.)

  • Optical Return Loss: 50 dB or more


Key Features



  • Absolute wavelength calibration using internal gas cell absorption line with automatic interval-based recalibration

  • Continuous wavelength tuning via proprietary external resonant structure

  • High SMSR and output stability for complete optical component characterization

  • Synchronous sweep functionality for high-speed dynamic range measurements

  • Fine wavelength resolution (0.001 nm) for precise DWDM channel selection


Typical Applications



  • DWDM system and component testing

  • Optical device characterization and validation

  • Spectral purity and linewidth measurement

  • Wavelength-dependent optical response analysis


Compatibility & Integration Supports synchronous sweep operation with compatible optical spectrum analyzers such as the Ando AQ6317B for enhanced measurement capability.

Specifications

ParameterValue
Power Range (dBm)'+3 dBm to +10 dBm (typical)
peak >7.5 dBm | Wavelength Range1520 nm to 1620 nm

Ando AQ4321D — Repair & Calibration Service

Aumictech offers NIST-traceable calibration and repair for the Ando AQ4321D. Calibration covers wavelength accuracy at 5 or more points across the full tuning range, mode-hop-free range, output power flatness, linewidth, and side-mode suppression ratio (SMSR). All calibrations ship with a NIST-traceable certificate. Turnaround is typically 1–3 business days after receipt.

Standard Cal
$450
Pass/fail cert + NIST sticker
Cal with Data
$650
Full NIST cert with measured values

Common Ando AQ4321D faults: output power drift, mode hops, fiber pigtail connector damage, wavelength inaccuracy. Common faults include output power drift after extended use, mode hops at specific wavelengths, and fiber pigtail connector damage. Full alignment and piezo calibration typically restore performance to spec.

Ando AQ4321D price

This Ando AQ4321D is listed at $6,779. Calibration is available separately from $450. Contact us for volume pricing or if you need multiple units.

Ando AQ4321D calibration cost

NIST-traceable calibration for the Ando AQ4321D is $450 (standard — pass/fail certificate and calibration sticker) or $650 (full measured data at every test point, reference standards documented, traceability chain included). Calibration for this instrument covers wavelength accuracy at 5 or more points across the full tuning range, mode-hop-free range, output power flatness, linewidth, and side-mode suppression ratio (SMSR). Turnaround is 1 to 3 business days after receipt. See full calibration details →

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