Agilent / Keysight DSO8104A Infiniium Oscilloscope: 1 GHz, 4 channels

The Agilent/Keysight DSO8104A Infiniium Oscilloscope delivers 1 GHz analog bandwidth across four channels, engineered for signal integrity measurements and mixed-signal analysis. With configurable memory up to 128 Mpts, 4 GSa/s sampling, and optional 16 digital channels for time-correlated acquisition, this instrument captures and characterizes both analog and digital activity simultaneously. The XGA touchscreen display with 256 intensity levels and Windows-based interface enables intuitive drag-and-drop measurements, while advanced pattern and mixed-signal triggering supports demanding debug workflows.

Technical Specifications

• Analog Bandwidth: 1 GHz across 4 channels


• Sampling Rate: 4 GSa/s maximum


• Memory Depth: 8 Mpts standard; optional up to 128 Mpts with MegaZoom III technology


• Vertical Resolution: 8 bits (>12 bits effective with averaging)


• Input Impedance: 1 MΩ ± 1% (13 pF typical) or 50 Ω ± 1.5%


• Vertical Sensitivity: 1 mV/div to 5 V/div (1 MΩ); 1 mV/div to 1 V/div (50 Ω)


• Input Coupling: AC/DC (1 MΩ); DC only (50 Ω)


• Rise Time (50 Ω): 350 ps


• Channel Isolation: 50 dB (DC to 50 MHz); 40 dB (>50 MHz to 500 MHz)


• Bandwidth Limit: 20 MHz hardware filter


• Acquisition Rate: Up to 2000 waveforms/sec


• Digital Channels (MSO models): 16 time-correlated channels

Key Features

• Pattern and mixed-signal triggering across all analog and digital channels


• XGA color display with 256 intensity levels and Windows touchscreen interface


• Drag-and-drop measurement capability for rapid analysis


• LAN (10BASE-T, 100BASE-TX, 1000BASE-T), USB, GPIB, and RS-232 connectivity


• LXI Class C compliant


• Low 5U rackmount profile

Physical & Operating Specifications

• Power Input: 100 to 240 VAC (auto-switching)


• Maximum Power Dissipation: 440 W


• Environmental Rating: Pollution Degree 2


• Minimum Installation Clearance: 75 mm bottom

Typical Applications Signal integrity analysis, mixed-signal embedded system debug, time-correlated analog-digital correlation, and high-frequency circuit characterization.