Anritsu MS9740A – Optical Spectrum Analyzer

The Anritsu MS9740A Optical Spectrum Analyzer delivers precise spectral analysis across the visible to near-infrared band, addressing requirements in R&D and manufacturing environments. This instrument evaluates optical devices

SFP, XFP, and SFP+ modules, transceivers, VCSEL and DFB lasers - displaying center wavelength, level, spectrum, SMSR, and OSNR on a single screen. Fast measurement cycles under 0.2 seconds enable rapid device characterization.

When paired with a Bit Error Rate Tester, it supports comprehensive analysis of transceiver outputs and WDM signals.

Technical Specifications

• Wavelength Range: 600 nm to 1750 nm


• Dynamic Range: 58 dB at 0.4 nm from peak (standard); 60 dB at 0.4 nm (high mode); 70 dB at 1 nm from peak


• Wavelength Accuracy: ±20 pm (1520–1620 nm, 0.03–0.2 nm resolution); ±50 pm (1530–1570 nm, 0.07–0.2 nm resolution); ±100 pm (1520–1620 nm, 0.5–1.0 nm resolution); ±300 pm (600–1520 nm)


• Wavelength Linearity: ±20 pm (1520–1620 nm)


• Resolution Bandwidth: 0.03, 0.05, 0.07, 0.1, 0.2, 0.5, 1.0 nm; minimum 30 pm


• Level Accuracy: ±0.4 dB (1310/1550 nm, –10 dBm input, >0.1 nm resolution)


• Level Linearity: ±0.05 dB (1550 nm, –30 to +20 dBm, optical ATT off)


• Polarization Dependency: ±0.05 dB (1550/1600 nm)


• Measurement Speed: <0.2 seconds (5 nm span)


• Input Power Range: –90 to +10 dBm (1250–1600 nm); –85 to +10 dBm (1000–1250 nm, 1600–1650 nm); –65 to +10 dBm (600–1000 nm, 1650–1700 nm); –55 to +10 dBm (1700–1750 nm)

Key Features

• Single-screen display of optical metrics


• Dual dynamic range modes for flexibility in noise floor and signal separation


• Fine resolution down to 30 pm for narrow-linewidth source characterization


• High optical sensitivity to –90 dBm in critical C-band window

Typical Applications

• Optical transceiver and module validation


• Laser spectral purity and linewidth measurement


• WDM signal analysis and channel isolation verification


• OSNR and SMSR evaluation in optical systems

Compatibility & Integration Integrates with Bit Error Rate Testers for joint spectral and signal-quality assessment of optical transceivers.