Keysight (Agilent) N8950A Autoranging System DC Power Supply, 1000 V, 30 A, 10000 W

The Keysight N8950A is a 10 kW autoranging system DC power supply engineered for automated test equipment (ATE) applications requiring precise, flexible power delivery. This single-output unit delivers 0–1000 V, 0–30 A, and up to 10,000 W within a compact 3U rack form factor. Unlike fixed-output supplies, the N8950A's autoranging architecture dynamically adjusts voltage and current combinations across its full power envelope, eliminating the need to over-specify equipment for varying load conditions.

Technical Specifications

• Maximum Voltage: 0–1000 V


• Maximum Current: 0–30 A


• Maximum Power: 10,000 W (10 kW)


• Programming Accuracy (Voltage): 0.1% of full-scale


• Programming Accuracy (Current): 0.2% of full-scale


• Output Ripple and Noise: 1600 mV p-p, 350 mV rms (voltage); 22 mA rms (current)


• Load Effect: 500 mV (voltage), 45 mA (current)


• Command Response Time: <25 ms AC Input


• Voltage: 400 VAC, 3-phase (360–440 VAC / ±10%)


• Frequency: 45–65 Hz Protection


• Over-Voltage Protection: 0–1100 V


• Over-Current Protection: Enabled


• Over-Temperature Protection: Enabled

Key Features

• Built-in voltage and current measurement with 0.1% and 0.2% accuracy respectively


• Autoranging output for dynamic load adaptation within the 10 kW power envelope


• Multiple communication interfaces: LAN (LXI Core), USB 2.0, GPIB, and analog


• Web server for browser-based remote control and monitoring


• Parallel operation capability: multiple units can be linked via master/slave control for scaled power output up to 40 kW (four-unit configuration)


• Operating temperature range: 0°C to 45°C


• Weight: 24.3 kg; Height: 5.25 inches (3U rack space)

Typical Applications Automated test systems, power conversion efficiency testing, semiconductor device characterization, and multi-rail load simulation where voltage and current requirements vary across test sequences.

Compatibility & Integration LAN (LXI Core), USB 2.0, and GPIB enable integration into distributed test architectures. Master/slave parallel linking allows configuration of multi-supply systems without external control logic.