Advantest Q8341 350nm-1000nm Optical Spectrum Analyzer

The Advantest Q8341 is a benchtop optical spectrum analyzer for precise measurement and analysis of optical spectra across the visible and near-infrared range. Operating from 350 nm to 1000 nm, it employs Fourier spectroscopy with a Michelson interferometer architecture to deliver coherence measurements and peak wavelength identification. A built-in He-Ne laser provides wavelength reference, ensuring traceable accuracy across the measurement range.

Technical Specifications

• Wavelength Measurement Range: 350 nm to 1000 nm


• Measurement Principle: Michelson interferometer with Fourier spectroscopy


• Wavelength Resolution: 0.05 nm at 650 nm (standard); 0.01 nm at 650 nm (optional)


• Peak Wavelength Measurement Resolution: 0.001 nm


• Wavelength Measurement Accuracy: ±0.05 nm (standard); ±0.01 nm (optional)


• Coherence Measurement Resolution: 0.001 mm


• Maximum Coherence Measurement Length: 10 mm (standard); 40 mm (optional)


• Maximum Input Level: ±10 dBm


• Measurement Speed: 0.5 seconds fast sweep (optional)


• Internal Wavelength Reference: He-Ne laser


• Display: 6.5-inch color LCD, 640 × 480 resolution


• Dimensions: 424 mm (H) × 132 mm (W) × 500 mm (D)


• Weight: 15 kg

Key Features

• Sub-nanometer wavelength resolution enables precise spectral characterization of laser diodes, including CD/DVD and blue-violet types


• Fourier spectroscopy with Michelson interferometer provides coherence and spectral phase information


• Fast measurement speed supports efficient thermal characterization and dynamic testing


• Dual-range coherence measurement accommodates short and extended optical path length analysis

Environmental & Power

• Operating Temperature: +10°C to +40°C


• Storage Temperature: −10°C to +50°C


• Relative Humidity: 85% maximum operating (non-condensing); 90% maximum storage (non-condensing)


• Power Supply: 100–120 VAC / 220–240 VAC, 50/60 Hz, ≤150 VA; automatic voltage switching

Typical Applications Laser diode characterization, optical coherence analysis, spectral purity assessment, and temperature-dependent optical property evaluation.