Agilent / Keysight U2002H 50 MHz – 24 GHz USB Power Sensor

The Keysight U2002H is a USB power sensor that delivers accurate RF power measurements from 50 MHz to 24 GHz without requiring a separate benchtop meter. It operates across a -50 dBm to +30 dBm dynamic range using dual low and high power paths, capturing up to 250 readings per second for real-time signal analysis. The sensor connects directly to a PC via USB 2.0, enabling immediate power display and control through BenchVue software or third-party programming environments.

Internal zeroing eliminates external calibration overhead and reduces measurement time, while internal and external triggering - including burst envelope detection - support both continuous and pulsed signal characterization. Trace display functionality aids gate placement and trigger threshold optimization for envelope analysis applications.

Technical Specifications

• Frequency Range: 50 MHz to 24 GHz


• Dynamic Power Range: −50 dBm to +30 dBm (low path: −50 to +3 dBm; high path: +3 to +30 dBm)


• Measurement Speed: Up to 250 readings/second


• RF Connector: 3.5 mm (m)


• Trigger Input: BNC male to SMB female


• Operating Temperature: 0 °C to +55 °C


• Interface: USB 2.0 compliant

Key Features

• Dual-path power measurement (low and high signal levels)


• Internal zeroing on live DUT connections; external zeroing recommended below −30 dBm


• Internal and external trigger modes with burst envelope triggering


• Real-time trace display for signal envelope visualization


• SCPI command compatibility for automated test systems

Typical Applications

• RF component and module power characterization


• Pulsed and burst signal analysis


• Power amplifier testing and validation


• Signal integrity verification across microwave frequencies

Compatibility & Integration The U2002H integrates with Keysight BenchVue (BV0007B) for native control and analysis. Legacy programming support includes Keysight VEE, LabVIEW, and Microsoft Visual Basic via SCPI command set, enabling direct integration into automated measurement systems and multiport test stations.