Agilent/Keysight 16804A

The Agilent/Keysight 16804A is a 136-channel portable logic analyzer built for signal capture and timing analysis in complex digital debug environments. It combines flexible memory architecture with dual-mode acquisition - timing and state analysis - on a 15-inch color LCD display. Engineers can scale memory from 1 M to 32 M samples as requirements evolve, while timing zoom reaches 4 GHz at 64K depth and conventional timing operates at 1.0 GHz across full channel capacity.

Technical Specifications

• Timing sample rate: 1 GHz (full channel), 0.5 GHz (half channel)


• Timing zoom: 4 GHz with 64K memory depth


• Conventional timing: 1.0 GHz / 0.5 GHz with deep memory


• Transitional timing: 500 MHz


• Time interval accuracy: 250 ps (4 GHz resolution)


• Between-pod accuracy: ± (1.0 ns + 0.01% reading) or ± (1.75 ns + 0.01% reading)


• Minimum data pulse width: 1 ns


• Minimum time between active clock edges: 2.0 ns


• Master-to-slave clock time: 1 ns minimum


• Slave-to-slave clock time: 4.0 ns minimum


• State clock pulse width: 1.0 ns (single and multiple edge) State Analysis (Synchronous)


• Maximum state clock rate: 450 MHz


• Maximum state data rate: 500 Mb/s


• tSetup/tHold: 0.5 tWidth; tWidth: 1.5 ns


• tSample range: –3.2 ns to +3.2 ns


• tSample adjustment resolution: 80 ps typical


• Clock qualifiers: 4 available Memory & Triggering


• Standard memory: 1 M samples


• Upgradeable to: 4 M, 16 M, or 32 M samples


• Trigger position options: Start, center, end, or user-defined


• Trigger actions: Go To, Trigger, e-mail alert, fill memory, selective store


• Sequence level counters: 1 per level; global counters: 2


• Flags: 4 available Display & Signal Integrity


• 15-inch XGA color TFT LCD (1024 × 768)


• Optional touchscreen available


• Eye scan for signal integrity analysis across buses


• Eye finder for automatic threshold and sample position setup


• Skew detection capabilities

Typical Applications Digital system verification, multi-protocol bus analysis, signal timing correlation, and signal integrity characterization across wide operating condition ranges.