Keysight 33522B 30MHz Waveform Generator

The Keysight 33522B is a dual-channel 30 MHz waveform generator delivering high-fidelity signal synthesis across independent channels with 14-bit arbitrary waveform resolution. It generates standard waveforms - sine, square, triangle, and pulse - plus white noise and modulated signals with comprehensive AM, FM, PM, and FSK capabilities. The instrument supports sweep functions in linear and logarithmic modes, coupled with flexible triggering from internal, external, manual, or line sources.

Design verification, manufacturing test, and research applications benefit from its low THD (<0.05% at 1 kHz), tight phase noise (<-135 dBc/Hz at 1 kHz offset from 1 MHz carrier), and amplitude flatness to ±0.25 dB up to 10 MHz.

Technical Specifications

• Bandwidth: 30 MHz


• Channels: 2 independent


• Arbitrary Waveform Memory: 14-bit resolution, 1 MSa/s sample rate, 16 Mpt record length per channel


• Sine Wave Frequency Range: 1 µHz to 30 MHz


• Sine Wave Amplitude Range: 1 mVpp to 10 Vpp (50 Ω load)


• Amplitude Flatness: ±0.25 dB up to 10 MHz; ±0.5 dB up to 30 MHz


• Total Harmonic Distortion: <0.05% at 1 kHz; <0.1% up to 30 MHz


• Phase Noise: <-135 dBc/Hz (1 kHz offset, 1 MHz carrier)


• Square Wave Frequency Range: 1 µHz to 30 MHz; edge time <10 ns typical


• Pulse Wave Frequency Range: 1 mHz to 10 MHz; pulse width 10 ns to period minus 10 ns


• Ramp Wave Frequency Range: 1 µHz to 5 MHz


• Output Impedance: 50 Ω ±2%


• Output Amplitude Accuracy: ±1.0% of setting ±1 mVpp


• Output Offset Accuracy: ±0.5% of setting ±5 mV

Key Features

• Modulation: AM (0–100% depth), FM (0–10 MHz deviation), PM (0–360°), FSK with programmable hop times


• Sweep modes: linear and logarithmic, 1 ms to 500 s rate, up/down/bidirectional direction


• Trigger types: edge, pulse width, and state detection


• TTL-compatible external trigger input and sync output


• White Gaussian noise with programmable crest factor

Typical Applications

• Electronic design verification and validation


• Manufacturing test and parametric characterization


• Research in signal processing and system design

Compatibility & Integration Trigger sources include internal, external, manual, and line. The 50 Ω output impedance and TTL-level I/O integrate readily into test benches and automated measurement systems.