Anritsu 37269E Passive Vector Network Analyzer, 40 MHz – 40 GHz

Anritsu 37269E,"Passive vector network analyzer supporting 40 MHz to 40 GHz, ideal for testing filters, antennas, and passive RF devices. It delivers high dynamic range, excellent measurement accuracy, and is suited for both manual and automated lab setups."

Model
Anritsu 37269E
Calibration
Available on request
Price
$17,500
Status
In stock
RFQ ref
37269E
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This unit

The Anritsu 37269E is a passive vector network analyzer that measures S-parameters and user-defined wave quantities across the 40 MHz to 40 GHz frequency band. Purpose-built for characterizing passive RF devices including filters, antennas, and transmission line networks, it delivers high dynamic range and measurement accuracy in both manual and automated laboratory environments.


Technical Specifications

Frequency coverage spans 40 MHz to 40 GHz. The instrument measures S11, S21, S22, S12, and user-defined combinations of wave quantities a1, a2, b1, and b2. Maximum 1601 data points with continuous sweep capability from N = 2 to 1601 discrete points per measurement. Measurement domains include frequency domain, CW draw, and optional high-speed time (distance) domain. Display formats encompass log magnitude, phase, log magnitude and phase, Smith chart (impedance and admittance), linear polar, log polar, group delay, linear magnitude, linear magnitude and phase, real, imaginary, real and imaginary, SWR, and power out. Test ports are universal K male connectors (standard); Option 15 provides K-female ports. Calibration methods include SOLT, offset short, waveguide, commercially available multiple line kits for metrology-grade LRL/LRM, adapter removal, and AutoCal® automatic precision modules for coaxial calibrations to 40 GHz.

Key Features



  • Swept power and frequency gain compression measurements for amplifier characterization

  • Direct frequency translation analysis via NxN multiple device solution utility

  • Multiport testing with balanced and differential measurement support

  • Optoelectronic device measurement with de-embedding and photo detector transfer function analysis

  • Embedding and de-embedding routines for fixture removal and structure effect simulation

  • 8 GB SD card internal storage for measurement, calibration data, and front-panel setups

  • USB Type A port for external memory device connectivity (text, S2P, bitmap export)

  • Dual GPIB ports (system and dedicated) for external controller integration

  • Option 4A secure storage on separate SD card


Typical Applications Amplifier testing, mixer characterization, multiport device analysis, optoelectronic component evaluation, and fixture de-embedding workflows.


Compatibility & Integration USB memory devices and SD card storage enable portable data management. Dual GPIB interface supports integration into automated test systems and external control architectures.

Specifications

ParameterValue
Frequency Range40 MHz to 40 GHz

Anritsu 37269E — Repair & Calibration Service

Aumictech offers NIST-traceable calibration and repair for the Anritsu 37269E. All calibrations are performed to NIST-traceable standards and ship with a certificate. Turnaround is typically 1–3 business days after receipt.

Standard Cal
$450
Pass/fail cert + NIST sticker
Cal with Data
$650
Full NIST cert with measured values

Anritsu 37269E price

This Anritsu 37269E is listed at $17,500. Calibration is available separately from $450. Contact us for volume pricing or if you need multiple units.

Anritsu 37269E calibration cost

NIST-traceable calibration for the Anritsu 37269E is $450 (standard — pass/fail certificate and calibration sticker) or $650 (full measured data at every test point, reference standards documented, traceability chain included). Turnaround is 1 to 3 business days after receipt. See full calibration details →

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