Agilent/Keysight 4277A

The Agilent/Keysight 4277A is a precision LCZ meter for impedance characterization across 10 kHz to 1 MHz. It measures inductance, capacitance, impedance magnitude, dissipation factor, quality factor, equivalent series resistance, conductance, and phase angle with 0.1% basic accuracy and 4½-digit resolution. The instrument supports three measurement circuit modes (AUTO, PARALLEL, SERIES) and offers selectable test signal levels at 1 Vrms or 20 mVrms.

High-speed measurement capability delivers results in 40–75 ms depending on parameter and frequency. Optional DC bias (±40 V maximum) enables component characterization under applied voltage. An integrated comparator function provides 10-bin sorting and GO/NO-GO testing for D/Q parameters in under 100 ms.

HP-IB control enables full remote operation, data logging, and integration into automated test systems. The 4277A operates across 0° to 55° C and accepts 100/120/220/240 Vac power, making it suitable for bench use, production quality control, and component development environments.

Technical Specifications

• Impedance Range: 10 Ω to 1 MΩ


• Test Frequency: 10 kHz to 1 MHz (701 selectable spot frequencies)


• Frequency Resolution: 100 Hz maximum; ±0.01% accuracy


• Measurement Parameters: L, C, |Z|, D, Q, ESR, G, phase angle


• Measurement Accuracy: 0.1% basic


• Display Resolution: 4½-digit


• Measurement Speed: SLOW/MED/FAST modes; 40–75 ms typical at 1 MHz


• Test Signal Level: 1 Vrms (HIGH) or 20 mVrms (LOW)


• DC Bias (optional): 0 to ±40 V programmable


• Comparator Function: 10-bin sorting, <100 ms measurement time


• Power Requirements: 100/120/220 Vac ±10%, 240 V (+5% to −10%), 48–66 Hz


• Power Consumption: 75 VA maximum


• Dimensions: 188 mm H × 426 mm W × 422 mm D


• Weight: 8.5 kg


• Operating Environment: 0° to 55° C; ≤95% RH at 40° C

Key Features

• Three measurement circuit modes for series and parallel component analysis


• Dual-level signal capability for low-noise and standard measurements


• High-speed C measurement at 40 ms enables production throughput


• Optional programmable DC bias options (H03, H04, H07) for voltage-dependent characterization


• Integrated GO/NO-GO comparator with 10-bin component binning

Typical Applications

• Quality control and incoming component inspection


• Production sorting and binning


• Component development and characterization


• Research and failure analysis

Compatibility & Integration

• HP-IB remote control and data transfer


• Optional component handler interface for automated sorting


• Standalone or system-integrated operation