Agilent/Keysight 54642D

The Agilent/Keysight 54642D is a 500 MHz mixed-signal oscilloscope combining analog oscilloscope and logic analyzer functionality in a single instrument. With 2 analog channels and 16 digital logic timing channels, it captures up to 18 simultaneous signals at 2 GSa/s, making it ideal for engineers debugging complex interactions in microcontroller and DSP-based systems. The 8 Mpts record length and 8 MB MegaZoom memory provide deep capture capability with 32 intensity levels for signal visibility across varying signal densities.

Technical Specifications

• Bandwidth: 500 MHz


• Analog Channels: 2


• Digital Logic Timing Channels: 16


• Sample Rate: 2 GSa/s


• Record Length: 8 Mpts


• Memory: 8 MB MegaZoom deep memory mapped to 32 intensity levels


• Vector Rate: 25 million vectors/sec


• Display: High-definition CRT with superior horizontal resolution

Key Features

• Waveform Math: FFT, subtract, multiply, integrate, and differentiate functions


• Flexible Triggering: Edge and pulse width triggering; advanced protocol triggers for CAN, I2C, LIN, SPI, and USB


• CAN Trigger Module: Isolates and triggers on specific frame content for protocol-level debugging


• Autoscale Function: Automatically configures active channels, trigger modes, vertical sensitivity, and time base


• Measurement Tools: Quick Meas for automated measurements and manual cursor-based analysis


• Multi-Language Support: Quick Help available in 11 languages


• Connectivity: Built-in floppy, RS-232, and parallel ports; GPIB interface with deep memory transfer capability (typical transfer time <70 seconds for 2 MB over GPIB)

Typical Applications The 54642D is particularly well-suited for systems with clock speeds approaching 100 MHz, including microcontroller debugging, DSP development, and mixed-signal protocol analysis where simultaneous analog and digital observation is essential.

Compatibility & Integration Standard legacy interface support via RS-232, parallel, and GPIB enables integration into established lab environments and automated test systems.