HP / Agilent 8013B 50 MHZ DUAL-OUTPUT PULSE GENERATOR

The HP/Agilent 8013B is a dual-output pulse generator delivering independent pulse control across two channels from 1 Hz to 50 MHz. It generates simultaneously positive and negative pulse trains with continuously adjustable width, delay, amplitude, and polarity, making it suitable for timing validation and digital circuit characterization across a wide range of electronic applications.

Technical Specifications Frequency & Repetition Rate

Frequency range: 1 Hz to 50 MHz

Repetition rate: continuously adjustable 1 Hz to 50 MHz in four ranges Pulse Parameters

Pulse width: continuously adjustable from <10 ns to 1 s

Pulse delay: continuously adjustable from <35 ns to 1 s; minimum 17 ns typical

Rise/fall time: fixed at 3.5 ns or variable from 5 ns to 0.5 s Output Characteristics

Output voltage: 0.2 V to 10 V into 50 Ω; maximum 16 V; adjustable via four-step attenuator down to 0.4 V

Output impedance: 50 Ω ± 3% switchable; 50 Ω ± 3% shunted by typically 20 pF with internal load connected or switched out

DC offset: ±2.5 V across 50 Ω with internal load connected; automatically switched off with internal load disconnected

Output modes: normal, complement, and double pulse capability; square wave adjustable 0.5 Hz to 25 MHz in four ranges Timing Accuracy

Delay jitter: <0.1% + 50 ps

Period jitter: 0.8 V either polarity with width >7 ns; maximum input amplitude 7 V

External triggering capability up to 50 MHz

Synchronous gating via gate input (>1.5 V or >1 kΩ to ground)

Trigger output with 25 ns ± 8 ns delay from leading edge of trigger input

Trigger input impedance: 50 Ω ± 10%, AC-coupled

Typical Applications

Logic circuit timing and validation

Digital signal path characterization

Timing measurements in test and measurement systems

High-frequency pulse train generation and analysis

Compatibility & Integration The 8013B integrates external trigger and gate signals for synchronized multi-channel operation, with selectable source impedance matching standard 50 Ω test environments.