Agilent/Keysight 8717B

The Agilent/Keysight 8717B is a discontinued transistor bias supply unit. Originally designed to support network analyzer systems, this instrument functioned as a dedicated bias supply for transistor characterization and related RF measurement applications. While the 8717B itself was purpose-built as a bias supply, contemporary instruments from the same product family - such as the 8711B and 8713B network analyzers - operated across complementary frequency ranges, providing context for the measurement ecosystems in which the 8717B was deployed.

Technical Specifications

The 8717B served as a bias supply component within larger network analyzer configurations. Related instruments from its era, the 8711B and 8713B, covered frequency ranges of 300 kHz to 1300 MHz and 300 kHz to 3000 MHz respectively. These systems supported optional AM delay measurement capabilities for frequency-translating device characterization. External scalar detectors, including the HP 86200B and 862001B, integrated with these platforms to extend measurement functionality.

Key Features

• Purpose-built transistor bias supply design


• Integration with contemporary network analyzer platforms


• Support for external scalar detector connectivity


• Optional AM delay measurement capability (via system integration)

Typical Applications The 8717B supported transistor bias requirements in RF characterization labs, enabling precise DC operating point control for active device measurements. In conjunction with compatible network analyzers, it facilitated S-parameter extraction and frequency-dependent device characterization across multiple frequency bands.

Compatibility & Integration The 8717B functioned within the Agilent/Keysight network analyzer ecosystem of its era. Integration with external detectors such as the HP 86200B and 862001B expanded measurement capability. This instrument was part of a product family that included the 8711B and 8713B network analyzers, reflecting the modular measurement architecture of 1980s–1990s RF test systems.