Anritsu MP1775A 03 Pulse Pattern Generator 4 channel 12.5 Gb/s *CALIBRATED*

The Anritsu MP1775A 03 is a four-channel pulse pattern generator delivering clean signals from 100 Mbps to 12.5 Gbps per channel. Engineered for high-speed digital signal generation and characterization, it evaluates optical and electrical components, modules, and devices in 10 Gbps WDM equipment environments. The instrument operates as a standalone source or integrates into comprehensive multi-channel test systems.

With 32 Megabits total pattern memory (8 Mbits per channel), it supports programmable patterns, PRBS sequences up to 2³¹-1 bits, SONET/SDH frames to OC-768c/STM-256c, and CID patterns for clock recovery stress testing.

Technical Specifications

• Data Rate: 100 Mbps to 12.5 Gbps per channel


• Channels: 4


• Pattern Memory: 32 Megabits total (8 Megabits per channel)


• Data Output Amplitude: 0.5 to 2.0 Vp-p per channel, independently settable


• Data Output Offset: –2.0 to +2.0 VOH, settable in 5 mV steps


• Clock Output Amplitude: 0.5 to 2.0 Vp-p, settable in 10 mV steps


• Clock Output Offset: –2.0 to +2.0 VOH, settable in 5 mV steps


• Clock Output Variable Delay: –500 to +500 ps in 1 ps steps


• Sync Output Amplitude: 1 Vp-p fixed


• Load Impedance: 50 Ohm (all outputs)


• Data/Clock Termination: Selectable GND or –2V (ECL)


• Sync Termination: 50 Ohm to GND


• Connectors: APC-3.5 (data and clock), SMA (sync)


• Error Insertion: Supported, rates 10⁻⁴ to 10⁻⁹, single-bit insertion

Key Features

• Internal clock option with selectable external clock input (0.8 to 2.0 Vp-p sine or pulse, >500 MHz)


• Independent amplitude and offset control per data channel


• Dual clock outputs with programmable delay


• Back-termination for waveform distortion reduction


• Front-panel cross-point adjustment


• GPIB and parallel control interfaces


• 3.5-inch FDD parameter memory (MS-DOS compatible)

Typical Applications

• 10 Gbps WDM equipment validation


• Optical transceiver characterization


• High-speed electrical component stress testing


• Clock recovery circuit evaluation


• SONET/SDH frame generation and analysis

Compatibility & Integration

• Pairs with MP1776A 4-Channel Error Detector for simultaneous BER testing


• Integrates into ME7760B 43.5 Gbps or ME7780A 48 Gbps BER Test Systems


• Combines with MP1801A 43.5G Multiplexer for 40 Gbps pattern generation


• Compatible with MP9861A E/O converter for 40 Gbps optical signal generation


• Optional MX177601A software enables SONET/SDH frame and CID pattern support