HP / Agilent 4262A Digital LCR Meter

The HP/Agilent 4262A is a digital LCR meter for precision measurement of inductance, capacitance, resistance, dissipation factor, and quality factor across component testing and production environments. Fully automatic ranging selects optimal measurement range and equivalent circuit mode - series or parallel - while front-panel offset adjustments compensate for stray capacitance (0 to 10 pF) and residual inductance (0 to 1 µH) of test fixtures. The instrument delivers 0.2% to 0.3% basic accuracy with a 3½ digit LED display and supports multiple measurement frequencies: 120 Hz (or 100 Hz with Option 010), 1 kHz, and 10 kHz at ±3% frequency accuracy.

Technical Specifications

• Measurement Parameters: Inductance (L), Capacitance (C), Resistance (R), Dissipation Factor (D), Quality Factor (Q)


• Equivalent Circuit Modes: Series and Parallel


• Measurement Ranges: Capacitance 0.01 pF to 19.99 mF; Inductance 0.01 µH to 1999 H; Resistance 1 mΩ to 19.99 MΩ


• Frequencies: 120 Hz (or 100 Hz with Option 010), 1 kHz, 10 kHz at ±3% accuracy


• Basic Accuracy: 0.2% to 0.3% of reading


• Test Signal Level: 1 V RMS (0.05 V RMS in Cp mode)


• Internal DC Bias: 1.5 V, 2.2 V, 6 VDC (±5%)


• External DC Bias: Up to +40 VDC maximum


• Measurement Speed: 1 kHz/10 kHz: 120–260 ms (C/L), 120–160 ms (R); 120/100 Hz: 900 ms (C/L), 700 ms (R)


• Ranging Time: 1 kHz/10 kHz: 180 ms/step; 120/100 Hz: 670 ms/step


• Reading Rate: ~30 ms internal trigger; external trigger available


• Warm-up Time: 15 minutes


• Temperature Coefficient: Accuracy doubles between 0–55°C relative to 23°C ±5°C

Key Features

• Automatic and manual ranging modes


• Internal self-test capability for functional verification


• Deviation measurements display difference between stored and measured values


• Offset adjustments for test fixture stray capacitance and residual inductance

Typical Applications Electrolytic and ceramic capacitor testing, filter coil measurement, pulse transformer characterization, dry cell internal resistance, semiconductor junction capacitance, and standard LCR component analysis.

Compatibility & Integration

• Option 001: BCD Data Output


• Option 004: Digital Comparator (GO/NO-GO testing)


• Option 010: 100 Hz lower test frequency


• Option 101: IEEE-488 GPIB Interface (incompatible with Options 001 and 004)